Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
2013 ◽
Vol 750-752
◽
pp. 2267-2270
2004 ◽
Vol 387-389
◽
pp. 29-33
◽
2006 ◽
Vol 37
(12)
◽
pp. 879-893