Influence of high-temperature exposure on sugar content and chipping quality of potatoes

1968 ◽  
Vol 45 (10) ◽  
pp. 359-365 ◽  
Author(s):  
Herman Timm ◽  
M. Yamaguchi ◽  
M. D. Clegg ◽  
J. C. Bishop
Keyword(s):  
High Temperature ◽  
Sugar Content ◽  
High Temperature Exposure ◽  
Temperature Exposure ◽  
Chipping Quality

scholarly journals Novel Multilayer SAW Temperature Sensor for Ultra-High Temperature Environments

Micromachines ◽  
2021 ◽  
Vol 12 (6) ◽  
pp. 643
Author(s):  
Xuhang Zhou ◽  
Qiulin Tan ◽  
Xiaorui Liang ◽  
Baimao Lin ◽  
Tao Guo ◽  
...  
Keyword(s):  
High Temperature ◽  
Temperature Sensor ◽  
X Ray Diffraction ◽  
Aero Engine ◽  
Before And After ◽  
Application Potential ◽  
Passive Sensors ◽  
Temperature Exposure ◽  
Engine Systems

Performing high-temperature measurements on the rotating parts of aero-engine systems requires wireless passive sensors. Surface acoustic wave (SAW) sensors can measure high temperatures wirelessly, making them ideal for extreme situations where wired sensors are not applicable. This study reports a new SAW temperature sensor based on a langasite (LGS) substrate that can perform measurements in environments with temperatures as high as 1300 °C. The Pt electrode and LGS substrate were protected by an AlN passivation layer deposited via a pulsed laser, thereby improving the crystallization quality of the Pt film, with the function and stability of the SAW device guaranteed at 1100 °C. The linear relationship between the resonant frequency and temperature is verified by various high-temperature radio-frequency (RF) tests. Changes in sample microstructure before and after high-temperature exposure are analyzed using scanning electron microscopy (SEM) and X-ray diffraction (XRD). The analysis confirms that the proposed AlN/Pt/Cr thin-film electrode has great application potential in high-temperature SAW sensors.

Creep Properties and Interfacial Microstructure of SiC Whisker Reinforced Si3N4

1989 ◽  
Vol 170 ◽  
Author(s):  
Håkan A. Swan ◽  
Colette O'meara
Keyword(s):  
High Temperature ◽  
Creep Resistance ◽  
Interfacial Microstructure ◽  
Deformation Mechanisms ◽  
Amorphous Films ◽  
Creep Tests ◽  
Creep Properties ◽  
High Temperature Exposure ◽  
Temperature Exposure

AbstractPreliminary creep tests were performed on SiC whisker reinforced and matrix Si3N4 material fabricated by the NPS technique. The material was extensively crystallised in the as received material, leaving only thin amorphous films surrounding the grains. No improvement in the creep resistance could be detected for the whisker reinforced material. The deformation mechanisms were found to be that of cavitation in the form of microcracks, predominantly at the whisker/matrix interfaces, and the formation of larger cracks. Extensive oxidation of the samples, as a result of high temperature exposure to air, was observed for the materials tested at 1375°C.

Sign in / Sign up

Export Citation Format

Share Document