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Total reflection X-ray fluorescence spectroscopy using synchrotron radiation for trace impurity analysis of silicon wafer surfaces
Metals and Materials
◽
10.1007/bf03025943
◽
1996
◽
Vol 2
(1)
◽
pp. 23-29
Author(s):
C. H. Chang
◽
Y. M. Koo
◽
H. Padmore
Keyword(s):
Synchrotron Radiation
◽
Fluorescence Spectroscopy
◽
Silicon Wafer
◽
Total Reflection
◽
Trace Impurity
◽
X Ray
◽
Impurity Analysis
◽
Wafer Surfaces
Download Full-text
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Cited By
References
Synchrotron Radiation Total Reflection X-ray Fluorescence Spectroscopy for Microcontamination Analysis on Silicon Wafer Surfaces
10.2172/784854
◽
1997
◽
Cited By ~ 1
Author(s):
Norikatsu Takaura
Keyword(s):
Synchrotron Radiation
◽
Fluorescence Spectroscopy
◽
Silicon Wafer
◽
Total Reflection
◽
X Ray
◽
Wafer Surfaces
Download Full-text
Total reflection x‐ray fluorescence spectroscopy using synchrotron radiation for wafer surface trace impurity analysis (invited)
Review of Scientific Instruments
◽
10.1063/1.1145957
◽
1995
◽
Vol 66
(2)
◽
pp. 1293-1297
◽
Cited By ~ 36
Author(s):
P. Pianetta
◽
N. Takaura
◽
S. Brennan
◽
W. Tompkins
◽
S. S. Laderman
◽
...
Keyword(s):
Synchrotron Radiation
◽
Fluorescence Spectroscopy
◽
Total Reflection
◽
Trace Impurity
◽
Wafer Surface
◽
X Ray
◽
Impurity Analysis
Download Full-text
Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’
Spectrochimica Acta Part B Atomic Spectroscopy
◽
10.1016/s0584-8547(01)00312-3
◽
2001
◽
Vol 56
(11)
◽
pp. 2261-2274
◽
Cited By ~ 51
Author(s):
S Pahlke
◽
L Fabry
◽
L Kotz
◽
C Mantler
◽
T Ehmann
Keyword(s):
Silicon Wafer
◽
State Of The Art
◽
Total Reflection
◽
X Ray
◽
Trace Contaminants
◽
Ultra Trace
◽
Wafer Surfaces
Download Full-text
Synchrotron radiation induced total reflection X-ray fluorescence of low Z elements on Si wafer surfaces at SSRL — comparison of excitation geometries and conditions
Spectrochimica Acta Part B Atomic Spectroscopy
◽
10.1016/s0584-8547(01)00322-6
◽
2001
◽
Vol 56
(11)
◽
pp. 2085-2094
◽
Cited By ~ 7
Author(s):
C Streli
◽
P Wobrauschek
◽
P Kregsamer
◽
G Pepponi
◽
P Pianetta
◽
...
Keyword(s):
Synchrotron Radiation
◽
Total Reflection
◽
X Ray
◽
Radiation Induced
◽
Wafer Surfaces
◽
Si Wafer
Download Full-text
High-Sensitivity Total Reflection X-Ray Fluorescence Spectroscopy of Silicon Wafers Using Synchrotron Radiation.
Analytical Sciences
◽
10.2116/analsci.11.515
◽
1995
◽
Vol 11
(3)
◽
pp. 515-518
◽
Cited By ~ 4
Author(s):
Stephen S. LADERMAN
◽
Alice Fischer-COLBRIE
◽
Ayako SHIMAZAKI
◽
Kunihiro MIYAZAKI
◽
Sean BRENNAN
◽
...
Keyword(s):
Synchrotron Radiation
◽
Fluorescence Spectroscopy
◽
High Sensitivity
◽
Silicon Wafers
◽
Total Reflection
◽
X Ray
Download Full-text
Improvement of total reflection X-ray fluorescence analysis of low Z elements on silicon wafer surfaces at the PTB monochromator beamline for undulator radiation at the electron storage ring BESSY II
Spectrochimica Acta Part B Atomic Spectroscopy
◽
10.1016/s0584-8547(01)00320-2
◽
2001
◽
Vol 56
(11)
◽
pp. 2073-2083
◽
Cited By ~ 22
Author(s):
B Beckhoff
◽
R Fliegauf
◽
G Ulm
◽
G Pepponi
◽
C Streli
◽
...
Keyword(s):
Silicon Wafer
◽
Storage Ring
◽
Fluorescence Analysis
◽
Total Reflection
◽
Electron Storage
◽
Undulator Radiation
◽
X Ray
◽
Wafer Surfaces
Download Full-text
Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy
Spectrochimica Acta Part B Atomic Spectroscopy
◽
10.1016/s0584-8547(03)00103-4
◽
2003
◽
Vol 58
(8)
◽
pp. 1445-1452
◽
Cited By ~ 3
Author(s):
Byung-Kook Huh
◽
Jae-Song Kim
◽
Nam-Su Shin
◽
Yang-Mo Koo
◽
Hye-Young Chung
Keyword(s):
Synchrotron Radiation
◽
Fluorescence Spectroscopy
◽
Depth Profile
◽
Impurity Concentration
◽
Total Reflection
◽
X Ray
◽
Si Wafer
Download Full-text
Ultra-trace analysis of metallic contaminations on silicon wafer surfaces by vapour phase decomposition/total reflection X-ray fluorescence (VPD/TXRF)
Spectrochimica Acta Part B Atomic Spectroscopy
◽
10.1016/0584-8547(91)80186-7
◽
1991
◽
Vol 46
(10)
◽
pp. 1369-1377
◽
Cited By ~ 72
Author(s):
C. Neumann
◽
P. Eichinger
Keyword(s):
Silicon Wafer
◽
Trace Analysis
◽
Vapour Phase
◽
Total Reflection
◽
Phase Decomposition
◽
X Ray
◽
Ultra Trace
◽
Wafer Surfaces
◽
Ultra Trace Analysis
Download Full-text
Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis
Spectrochimica Acta Part B Atomic Spectroscopy
◽
10.1016/s0584-8547(96)01674-6
◽
1997
◽
Vol 52
(7)
◽
pp. 901-906
◽
Cited By ~ 38
Author(s):
P. Wobrauschek
◽
R. Görgl
◽
P. Kregsamer
◽
Ch. Streli
◽
S. Pahlke
◽
...
Keyword(s):
Synchrotron Radiation
◽
Fluorescence Analysis
◽
Total Reflection
◽
X Ray
◽
Wafer Surfaces
◽
Si Wafer
Download Full-text
Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers
Spectrochimica Acta Part B Atomic Spectroscopy
◽
10.1016/s0584-8547(03)00218-0
◽
2003
◽
Vol 58
(12)
◽
pp. 2105-2112
◽
Cited By ~ 17
Author(s):
C. Streli
◽
G. Pepponi
◽
P. Wobrauschek
◽
N. Zöger
◽
P. Pianetta
◽
...
Keyword(s):
Synchrotron Radiation
◽
Total Reflection
◽
X Ray
◽
Radiation Induced
◽
Wafer Surfaces
◽
Si Wafer
Download Full-text
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