Grazing Incidence X-ray Diffraction Study on Surface Crystal Structure of Polyethylene Thin Films

2005 ◽  
Vol 53 (3) ◽  
pp. 213-222 ◽  
Author(s):  
Hirohiko Yakabe ◽  
Keiji Tanaka ◽  
Toshihiko Nagamura ◽  
Sono Sasaki ◽  
Osami Sakata ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Diffraction Study ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Crystal

Crystal structure of oligothiophene thin films characterized by two-dimensional grazing incidence X-ray diffraction

2013 ◽  
Vol 53 (1S) ◽  
pp. 01AD01 ◽  
Author(s):  
Takeshi Watanabe ◽  
Tomoyuki Koganezawa ◽  
Mamoru Kikuchi ◽  
Christine Videlot-Ackermann ◽  
Jörg Ackermann ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Grazing Incidence ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray

Determination of Crystal Structure and Cation Distribution in Thin Films

1991 ◽  
Vol 35 (A) ◽  
pp. 151-157
Author(s):  
G. Will ◽  
T. C. Huang ◽  
F. Sequeda
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Grazing Incidence ◽  
High Tech ◽  
X Ray Diffraction ◽  
X Ray ◽  
Depth Profiles ◽  
Scanning Geometry

The structural characterization of thin films is important for research development and manufacturing of electronic, magnetic, optical, and other high-tech materials. The grazing incidence X-ray diffraction technique has bean used successfully for the determination of crystalline phases, structural-depth profiles, crystallite size, and strain, etc. of thin films with thickness's down to a few tens of Å, If the crystal structure, e.g. the distribution of atoms in the unit cell, or the crystallinity and texture (or preferred orientation) of a film is of interest, the conventional Bragg-Brentano diffractometer technique with the θ-2θ scanning geometry has been found to be appropriate.

Grazing-incidence X-ray diffraction study of rubrene epitaxial thin films

2012 ◽  
Vol 19 (5) ◽  
pp. 682-687 ◽  
Author(s):  
Enrico Fumagalli ◽  
Marcello Campione ◽  
Luisa Raimondo ◽  
Adele Sassella ◽  
Massimo Moret ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Grazing Incidence ◽  
Epitaxial Thin Films ◽  
X Ray Diffraction ◽  
X Ray

Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films Epitaxially Grown on Crystalline Substrate

1997 ◽  
pp. 659-664
Author(s):  
Kenji Ishida ◽  
Akinori Kita ◽  
Kouichi Hayashi ◽  
Toshihisa Horiuchi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Organic Thin Films ◽  
Grazing Incidence ◽  
Energy Dispersive ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystalline Substrate

Grazing Incidence In-Plane X-Ray Diffraction Study on Oriented Copper Phthalocyanine Thin Films

2002 ◽  
Vol 41 (Part 1, No. 8) ◽  
pp. 5467-5471 ◽  
Author(s):  
Masato Ofuji ◽  
Katsuhiko Inaba ◽  
Kazuhiko Omote ◽  
Hajime Hoshi ◽  
Yoichi Takanishi ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Copper Phthalocyanine ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals X-Ray Diffraction Study of Crystal Structure and Thin Films of Chromium(II) Phthalocyaninate

2020 ◽  
Vol 13 (1) ◽  
pp. 13-18
Author(s):  
Aleksandr S. Sukhikh ◽  
Darya D. Klyamer ◽  
Tamara V. Basova
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray
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