STEM (scanning transmission electron microscopy) analysis of femtosecond laser pulse induced damage to bulk silicon
2004 ◽
Vol 82
(10)
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pp. 2865-2870
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Keyword(s):
Keyword(s):
2016 ◽
Vol 51
(16)
◽
pp. 7691-7698
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2015 ◽
Vol 110
◽
pp. 60-67
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1985 ◽
Vol 54
(2)
◽
pp. 598-607
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Keyword(s):
1990 ◽
Vol 73
(10)
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pp. 2916-2921
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2002 ◽
Vol 82
(14)
◽
pp. 2737-2754
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1993 ◽
Vol 28
(18)
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pp. 4957-4961
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