Interference effects in 157 nm laser ablated cones in polycarbonate and application to spatial coherence measurement

2009 ◽  
Vol 95 (2) ◽  
pp. 319-323 ◽  
Author(s):  
P. E. Dyer ◽  
C. D. Walton ◽  
R. Zakaria
PhotoniX ◽  
2021 ◽  
Vol 2 (1) ◽  
Author(s):  
Deming Peng ◽  
Zhaofeng Huang ◽  
Yonglei Liu ◽  
Yahong Chen ◽  
Fei Wang ◽  
...  

AbstractInformation encryption with optical technologies has become increasingly important due to remarkable multidimensional capabilities of light fields. However, the optical encryption protocols proposed to date have been primarily based on the first-order field characteristics, which are strongly affected by interference effects and make the systems become quite unstable during light–matter interaction. Here, we introduce an alternative optical encryption protocol whereby the information is encoded into the second-order spatial coherence distribution of a structured random light beam via a generalized van Cittert–Zernike theorem. We show that the proposed approach has two key advantages over its conventional counterparts. First, the complexity of measuring the spatial coherence distribution of light enhances the encryption protocol security. Second, the relative insensitivity of the second-order statistical characteristics of light to environmental noise makes the protocol robust against the environmental fluctuations, e.g, the atmospheric turbulence. We carry out experiments to demonstrate the feasibility of the coherence-based encryption method with the aid of a fractional Fourier transform. Our results open up a promising avenue for further research into optical encryption in complex environments.


1996 ◽  
Vol 77 (23) ◽  
pp. 4756-4759 ◽  
Author(s):  
T. Ditmire ◽  
E. T. Gumbrell ◽  
R. A. Smith ◽  
J. W. G. Tisch ◽  
D. D. Meyerhofer ◽  
...  

2013 ◽  
Vol 21 (4) ◽  
pp. 4061 ◽  
Author(s):  
Kimmo Saastamoinen ◽  
Jani Tervo ◽  
Jari Turunen ◽  
Pasi Vahimaa ◽  
Ari T. Friberg

2014 ◽  
Author(s):  
Belal K. Khajeh ◽  
Thi-Kim-Trinh Tran ◽  
M. Nadeem Akram

1985 ◽  
Vol 54 ◽  
Author(s):  
Tim D. Sullivan ◽  
Dieter G. Ast

ABSTRACTA method for extracting quantitative information from weak diffraction features at or near matrix reflections is described. The technique requires an accurate knowledge of the fall-off of the matrix reflection. This fall-off was studied both experimentally and theoretically for a wide range of coherence conditions in the microscope. Subtraction of this matrix contribution from the total intensity of an [004] reflection from a E=13 (001) twist boundary shows that the streak arises from local as well as from long range interference effects. The latter contribution varies with spatial coherence length which depends on the condenser setting of the microscope.


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