Measurement of ionization rate of charge carriers and breakdown characteristics of CVD-grown 4H-SiC diodes under steady magnetic field
2017 ◽
Vol 16
(3)
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pp. 503-513
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2003 ◽
Vol 24
(1)
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pp. 130-136
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2018 ◽
Vol 122
(48)
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pp. 27451-27455
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2009 ◽
Vol 45
(3)
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pp. 1254-1257
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1980 ◽
Vol 24
(3)
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pp. 479-482
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