Quantitative Energy-filtering Transmission Electron Microscopy in Materials Science

2000 ◽  
Vol 6 (2) ◽  
pp. 161-172 ◽  
Author(s):  
Werner Grogger ◽  
Ferdinand Hofer ◽  
Peter Warbichler ◽  
Gerald Kothleitner
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Steel Specimen ◽  
Elemental Distribution ◽  
Secondary Phases ◽  
Energy Filtering ◽  
Transmission Electron ◽  
The Matrix ◽  
Titanate Ceramics

Energy-filtered transmission electron microscopy (EFTEM) can be used to acquire elemental distribution images at high lateral resolution within short acquisition times. In this article, we present an overview of typical problems from materials science which can be preferentially solved by means of EFTEM. In the first example, we show how secondary phases in a steel specimen can be easily detected by recording jump ratio images of the matrix element under rocking beam illumination. Secondly, we describe how elemental maps can be converted into concentration maps. A Ba-Nd-titanate ceramics serves as a typical materials science example exhibiting three different compounds with varying composition.

Newly formed phyllosilicates in rock matrices and fractures from CRP-3 core (Antarctica): an electron microscopy study

Clay Minerals ◽  
2007 ◽  
Vol 42 (1) ◽  
pp. 21-43 ◽  
Author(s):  
G. Giorgetti ◽  
F. S. Aghib ◽  
K. J. T. Livi ◽  
A.-C. Gaillot ◽  
T. J. Wilson
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Marine Sediments ◽  
Ross Sea ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Secondary Phases ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron ◽  
The Matrix

AbstractA scanning and transmission electron microscopy study has been performed on Oligocene glacio-marine sediments, Devonian sandstones, and Jurassic dolerites recovered during CRP-3 drilling in the Ross Sea (Antarctica). Newly formed clay minerals occur in the rock matrices and as fillings in veins and faults which crosscut the whole sequence. Authigenic clays in sediments consist of beidellite-montmorillonite, berthierine/chlorite intergrowths and illite. Al,K-rich smectites and kaolinite occur in the Devonian sandstones. Saponite, berthierine/chlorite intergrowths, and Fe-hydroxides develop in the altered dolerites. Hence, the composition of the secondary phases depends also on the geochemistry of the rock they grow in. Within each sample, the same authigenic minerals form in the matrix and in the vein/fault. Clays precipitated from fluids, with variable fO2 values, which circulated in the system during the contemporaneous diagenetic and faulting events.

scholarly journals Energy-filtering transmission electron microscopy in materials science

1992 ◽  
Vol 3 (2-3) ◽  
pp. 141-157 ◽  
Author(s):  
Ludwig Reimer ◽  
Inge Fromm ◽  
Christoph Hülk ◽  
Reinhold Rennekamp
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Energy Filtering ◽  
Transmission Electron

Electron holography in materials science

1991 ◽  
Vol 49 ◽  
pp. 670-671
Author(s):  
Hannes Lichte ◽  
Edgar Voelkl
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Materials Science ◽  
Fourier Spectrum ◽  
Object Wave ◽  
Electron Holography ◽  
Reconstruction Procedure ◽  
Numerical Reconstruction ◽  
Transmission Electron ◽  
Unique Interpretation

The object wave o(x,y) = a(x,y)exp(iφ(x,y)) at the exit face of the specimen is described by two real functions, i.e. amplitude a(x,y) and phase φ(x,y). In stead of o(x,y), however, in conventional transmission electron microscopy one records only the real intensity I(x,y) of the image wave b(x,y) loosing the image phase. In addition, referred to the object wave, b(x,y) is heavily distorted by the aberrations of the microscope giving rise to loss of resolution. Dealing with strong objects, a unique interpretation of the micrograph in terms of amplitude and phase of the object is not possible. According to Gabor, holography helps in that it records the image wave completely by both amplitude and phase. Subsequently, by means of a numerical reconstruction procedure, b(x,y) is deconvoluted from aberrations to retrieve o(x,y). Likewise, the Fourier spectrum of the object wave is at hand. Without the restrictions sketched above, the investigation of the object can be performed by different reconstruction procedures on one hologram. The holograms were taken by means of a Philips EM420-FEG with an electron biprism at 100 kV.

The use of an energy-filtering electron microscope to reduce chromatic aberration in images of thick biological specimens

1986 ◽  
Vol 44 ◽  
pp. 88-91
Author(s):  
L. D. Peachey ◽  
J. P. Heath ◽  
G. Lamprecht
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Beam ◽  
Cross Section ◽  
Electron Scattering ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Incident Electron Energy ◽  
Energy Filtering ◽  
Transmission Electron

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.

scholarly journals Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification

2011 ◽  
Vol 17 (S2) ◽  
pp. 790-791
Author(s):  
M Watanabe ◽  
F Allen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Acquisition Scheme ◽  
Spectrum Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Atomic-scale structural and compositional analyses of Ruddlesden-Popper planar faults in AO-excess SrTiO3 (A = Sr2+, Ca2+, Ba2+) ceramics

2009 ◽  
Vol 24 (8) ◽  
pp. 2596-2604 ◽  
Author(s):  
Sašo Šturm ◽  
Makoto Shiojiri ◽  
Miran Čeh
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dark Field ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Initial Stage ◽  
Final Microstructure ◽  
Scanning Transmission ◽  
The Matrix ◽  
Annular Dark Field

The microstructure in AO-excess SrTiO3 (A = Sr2+, Ca2+, Ba2+) ceramics is strongly affected by the formation of Ruddlesden-Popper fault–rich (RP fault) lamellae, which are coherently intergrown with the matrix of the perovskite grains. We studied the structure and chemistry of RP faults by applying quantitative high-resolution transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy analyses. We showed that the Sr2+ and Ca2+ dopant ions form RP faults during the initial stage of sintering. The final microstructure showed preferentially grown RP fault lamellae embedded in the central part of the anisotropic perovskite grains. In contrast, the dopant Ba2+ ions preferably substituted for Sr2+ in the SrTiO3 matrix by forming a BaxSr1−xTiO3 solid solution. The surplus of Sr2+ ions was compensated structurally in the later stages of sintering by the formation of SrO-rich RP faults. The resulting microstructure showed RP fault lamellae located at the surface of equiaxed BaxSr1-xTiO3 perovskite grains.

scholarly journals Analysis of Metal/Plastic Interfaces by Energy-Filtering Transmission Electron Microscopy

2012 ◽  
Vol 48 (9) ◽  
pp. 322-330 ◽  
Author(s):  
Shin HORIUTI ◽  
Takeshi HANADA ◽  
Takayuki MIYAMAE ◽  
Tadae YAMANAKA ◽  
Kogoro OOSUMI ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Filtering ◽  
Transmission Electron
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