A scene based nonuniformity correction algorithm for line scanning infrared image

2014 ◽  
Vol 21 (6) ◽  
pp. 778-786 ◽  
Author(s):  
Fan Fan ◽  
Yong Ma ◽  
Bo Zhou ◽  
Yu Fang ◽  
Jinhui Han ◽  
...  
2016 ◽  
Vol 9 (1) ◽  
pp. 106-113
Author(s):  
陈世伟 CHEN Shi-wei ◽  
杨小冈 YANG Xiao-gang ◽  
张胜修 ZHANG Sheng-xiu ◽  
刘云峰 LIU Yun-feng

2020 ◽  
Vol 49 (1) ◽  
pp. 110002-110002
Author(s):  
白乐 Le BAI ◽  
赖雪峰 Xue-feng LAI ◽  
韩维强 Wei-qiang HAN ◽  
王昊光 Hao-guang WANG ◽  
周金梅 Jin-mei ZHOU ◽  
...  

2019 ◽  
Vol 9 (10) ◽  
pp. 1993 ◽  
Author(s):  
Ende Wang ◽  
Ping Jiang ◽  
Xukui Hou ◽  
Yalong Zhu ◽  
Liangyu Peng

In the uncooled infrared imaging systems, owing to the non-uniformity of the amplifier in the readout circuit, the infrared image has obvious stripe noise, which greatly affects its quality. In this study, the generation mechanism of stripe noise is analyzed, and a new stripe correction algorithm based on wavelet analysis and gradient equalization is proposed, according to the single-direction distribution of the fixed image noise of infrared focal plane array. The raw infrared image is transformed by a wavelet transform, and the cumulative histogram of the vertical component is convolved by a Gaussian operator with a one-dimensional matrix, in order to achieve gradient equalization in the horizontal direction. In addition, the stripe noise is further separated from the edge texture by a guided filter. The algorithm is verified by simulating noised image and real infrared image, and the comparison experiment and qualitative and quantitative analysis with the current advanced algorithm show that the correction result of the algorithm in this paper is not only mild in visual effect, but also that the structural similarity (SSIM) and peak signal-to-noise ratio (PSNR) indexes can get the best result. It is shown that this algorithm can effectively remove stripe noise without losing details, and the correction performance of this method is better than the most advanced method.


2015 ◽  
Vol 22 (4) ◽  
pp. 614-622 ◽  
Author(s):  
Jun Huang ◽  
Yong Ma ◽  
Fan Fan ◽  
Xiaoguang Mei ◽  
Zhe Liu

2010 ◽  
Vol 18 (1) ◽  
Author(s):  
T. Orżanowski ◽  
H. Madura

AbstractIn the paper, reference-based nonuniformity correction methods for microbolometer infrared detectors are discussed and tested. In order to evaluate their effectiveness, a complete readout circuit for amorphous silicon microbolometer focal plane array has been designed. The tests were carried out on a developed stand including several extended blackbodies. Some modification of standard two-point correction algorithm incorporating detectors response at external shutter to compensate offset drift is also proposed. The obtained results are presented.


2013 ◽  
Author(s):  
Lixiang Geng ◽  
Qian Chen ◽  
Feng Shi ◽  
Changjiang Wang ◽  
Xuelian Yu

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