Wide band digital predistortion using iterative feedback decomposition

2018 ◽  
Vol 100 (1) ◽  
pp. 93-108
Author(s):  
Ahmad Shokair ◽  
Ali Beydoun ◽  
Dang-Kièn Germain Pham ◽  
Chadi Jabbour ◽  
Patricia Desgreys
2013 ◽  
Vol 711 ◽  
pp. 641-646
Author(s):  
Qing Zhi Du ◽  
Wei Yu ◽  
Jun Yang ◽  
Jing Jing Ma ◽  
Pei Xie

In this paper,a new digital predistortion (DPD) approach is presented for linearization of power amplifies wide-band orthogonal frequency division multiplexing (OFDM) signals using a QRD-RLS method. The proposed DPD technique employs the improved QR decomposition of input OFDM signals' matrix and can significantly improve the error magnitude of vector (EMV) and performance to offset the nonlinear distortion of RF PAs. In addition, the proposed DPD approach provide a less complex and faster speed linearization system compared with LMS algorithm.


1966 ◽  
Vol 24 ◽  
pp. 262-266 ◽  
Author(s):  
M. Golay
Keyword(s):  

During the last 5 years, we have developed a seven-colour photometry at the Geneva Observatory. Our multicolour photo-electric system is of a wide-band type; the bandwidth being about 500Å for four filters. The three others are similar to theUBVsystem. In Table 1 we give the filter combinations used in our photometry (1).


Author(s):  
Joanna L. Batstone

Interest in II-VI semiconductors centres around optoelectronic device applications. The wide band gap II-VI semiconductors such as ZnS, ZnSe and ZnTe have been used in lasers and electroluminescent displays yielding room temperature blue luminescence. The narrow gap II-VI semiconductors such as CdTe and HgxCd1-x Te are currently used for infrared detectors, where the band gap can be varied continuously by changing the alloy composition x.Two major sources of precipitation can be identified in II-VI materials; (i) dopant introduction leading to local variations in concentration and subsequent precipitation and (ii) Te precipitation in ZnTe, CdTe and HgCdTe due to native point defects which arise from problems associated with stoichiometry control during crystal growth. Precipitation is observed in both bulk crystal growth and epitaxial growth and is frequently associated with segregation and precipitation at dislocations and grain boundaries. Precipitation has been observed using transmission electron microscopy (TEM) which is sensitive to local strain fields around inclusions.


Author(s):  
J.B. Posthill ◽  
R.P. Burns ◽  
R.A. Rudder ◽  
Y.H. Lee ◽  
R.J. Markunas ◽  
...  

Because of diamond’s wide band gap, high thermal conductivity, high breakdown voltage and high radiation resistance, there is a growing interest in developing diamond-based devices for several new and demanding electronic applications. In developing this technology, there are several new challenges to be overcome. Much of our effort has been directed at developing a diamond deposition process that will permit controlled, epitaxial growth. Also, because of cost and size considerations, it is mandatory that a non-native substrate be developed for heteroepitaxial nucleation and growth of diamond thin films. To this end, we are currently investigating the use of Ni single crystals on which different types of epitaxial metals are grown by molecular beam epitaxy (MBE) for lattice matching to diamond as well as surface chemistry modification. This contribution reports briefly on our microscopic observations that are integral to these endeavors.


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