A 2-µm Continuous-Wave Laser System for Safe and High-Precision Dissection During NOTES Procedures

2010 ◽  
Vol 55 (9) ◽  
pp. 2463-2470 ◽  
Author(s):  
Xavier Dray ◽  
Gianfranco Donatelli ◽  
Devi Mukkai Krishnamurty ◽  
Elena Dubcenco ◽  
Ronald J. Wroblewski ◽  
...  
2009 ◽  
Vol 69 (5) ◽  
pp. AB162
Author(s):  
Xavier Dray ◽  
Gianfranco Donatelli ◽  
Devi Mukkai Krishnamurty ◽  
Ronald J. Wroblewski ◽  
Lia R. Assumpcao ◽  
...  

AIP Advances ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 025038
Author(s):  
Lang Bai ◽  
Gang Zheng ◽  
Bin Sun ◽  
Xiongxing Zhang ◽  
Qiming Sheng ◽  
...  

Author(s):  
Khawar Abbas ◽  
Seyedhamidreza Alaie ◽  
Mani Hossein-Zadeh ◽  
Zayd C. Leseman

We present a noncontact method to calibrate micro/nanostructures using sub-nN forces. In this work, a microcantilever’s material properties as well as damping ratio are determined using two independent laser systems. A continuous wave laser system is used as a heterodyne interferometer to determine displacements while another laser system is pulsed in order to produce radiation pressure. A noncontact method is preferred while calibrating sub-μN forces since no material is transferred between the calibrating apparatus and (NEMS/MEMS) to be calibrated. The incidence force is calculated from the optical properties of Si cantilever. Simulations presented in this work shows that thermal gradient along the length of the cantilever beam is very small to affect its physical properties due to the difference in time scales on which both operate.


2007 ◽  
Vol 177 (4S) ◽  
pp. 614-614
Author(s):  
Thorsten Bach ◽  
Thomas R.W. Herrmann ◽  
Roman Ganzer ◽  
Andreas J. Gross

2021 ◽  
Vol 142 ◽  
pp. 107182
Author(s):  
S. Pramodini ◽  
L.S. Aravinda ◽  
K.K. Nagaraja ◽  
P. Poornesh

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