A zero-bit Fourier image watermarking for print-cam process

2018 ◽  
Vol 78 (2) ◽  
pp. 2621-2638 ◽  
Author(s):  
Khadija Gourrame ◽  
Hassan Douzi ◽  
Rachid Harba ◽  
Rabia Riad ◽  
Frederic Ros ◽  
...  
Electronics ◽  
2022 ◽  
Vol 11 (2) ◽  
pp. 266
Author(s):  
Khadija Gourrame ◽  
Frederic Ros ◽  
Hassan Douzi ◽  
Rachid Harba ◽  
Rabia Riad

Digital image watermarking is an active research field since it provides protection, security, and authenticity of data. This paper presents development and implementation of a blind and robust watermarking application for ID images under a print-cam system. In the present case, the images are watermarked and printed on ID cards and then detected freehandedly with a smartphone camera. In order to design an efficient and robust image watermarking application, the attacks produced in print-cam processes, such as geometric distortions, must be resolved. Accordingly, the proposed watermarking approach is applied in the Fourier domain. Then, a frame-based projective rectification is integrated to deal with geometric distortions by using detection of Hough lines. Moreover, better robustness against print-cam watermarking attacks was achieved compared with the existing methods, and an Android application was designed and implemented based on the proposed scheme.


Author(s):  
A. Olsen ◽  
J.C.H. Spence ◽  
P. Petroff

Since the point resolution of the JEOL 200CX electron microscope is up = 2.6Å it is not possible to obtain a true structure image of any of the III-V or elemental semiconductors with this machine. Since the information resolution limit set by electronic instability (1) u0 = (2/πλΔ)½ = 1.4Å for Δ = 50Å, it is however possible to obtain, by choice of focus and thickness, clear lattice images both resembling (see figure 2(b)), and not resembling, the true crystal structure (see (2) for an example of a Fourier image which is structurally incorrect). The crucial difficulty in using the information between Up and u0 is the fractional accuracy with which Af and Cs must be determined, and these accuracies Δff/4Δf = (2λu2Δf)-1 and ΔCS/CS = (λ3u4Cs)-1 (for a π/4 phase change, Δff the Fourier image period) are strongly dependent on spatial frequency u. Note that ΔCs(up)/Cs ≈ 10%, independent of CS and λ. Note also that the number n of identical high contrast spurious Fourier images within the depth of field Δz = (αu)-1 (α beam divergence) decreases with increasing high voltage, since n = 2Δz/Δff = θ/α = λu/α (θ the scattering angle). Thus image matching becomes easier in semiconductors at higher voltage because there are fewer high contrast identical images in any focal series.


Author(s):  
Chauhan Usha ◽  
Singh Rajeev Kumar

Digital Watermarking is a technology, to facilitate the authentication, copyright protection and Security of digital media. The objective of developing a robust watermarking technique is to incorporate the maximum possible robustness without compromising with the transparency. Singular Value Decomposition (SVD) using Firefly Algorithm provides this objective of an optimal robust watermarking technique. Multiple scaling factors are used to embed the watermark image into the host by multiplying these scaling factors with the Singular Values (SV) of the host image. Firefly Algorithm is used to optimize the modified host image to achieve the highest possible robustness and transparency. This approach can significantly increase the quality of watermarked image and provide more robustness to the embedded watermark against various attacks such as noise, geometric attacks, filtering attacks etc.


2018 ◽  
Vol 6 (6) ◽  
pp. 437-441
Author(s):  
Amit Kumar ◽  
Girish Parmar ◽  
Rajesh Bhatt
Keyword(s):  

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