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Structure and property characterization of low-k dielectric porous thin films
Journal of Electronic Materials
◽
10.1007/s11664-001-0035-x
◽
2001
◽
Vol 30
(4)
◽
pp. 304-308
◽
Cited By ~ 12
Author(s):
Barry J. Bauer
◽
Eric K. Lin
◽
Hae-Jeong Lee
◽
Howard Wang
◽
Wen-Li Wu
Keyword(s):
Thin Films
◽
Structure And Property
◽
Porous Thin Films
◽
Property Characterization
◽
Low K
Download Full-text
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References
Structure and property characterization of low-k dielectric porous thin films determined by x-ray reflectivity and small-angle neutron scattering
10.1063/1.1354441
◽
2001
◽
Author(s):
Eric K. Lin
Keyword(s):
Thin Films
◽
Neutron Scattering
◽
Small Angle
◽
Small Angle Neutron Scattering
◽
X Ray
◽
Structure And Property
◽
Porous Thin Films
◽
Property Characterization
◽
Low K
Download Full-text
Structure and Property Characterization of Low-k Dielectric Porous Thin Films Determined by X-Ray Reflectivity and Small-Angle Neutron Scattering
Springer Series in Advanced Microelectronics - Low Dielectric Constant Materials for IC Applications
◽
10.1007/978-3-642-55908-2_3
◽
2003
◽
pp. 75-93
◽
Cited By ~ 1
Author(s):
E. K. Lin
◽
H. Lee
◽
B. J. Bauer
◽
H. Wang
◽
J. T. Wetzel
◽
...
Keyword(s):
Thin Films
◽
Neutron Scattering
◽
Small Angle
◽
Small Angle Neutron Scattering
◽
X Ray
◽
Structure And Property
◽
Porous Thin Films
◽
Property Characterization
◽
Low K
Download Full-text
Mechanical characterization of low-k and barrier dielectric thin films
Microelectronic Engineering
◽
10.1016/j.mee.2005.07.018
◽
2005
◽
Vol 82
(3-4)
◽
pp. 368-373
◽
Cited By ~ 26
Author(s):
N. Chérault
◽
G. Carlotti
◽
N. Casanova
◽
P. Gergaud
◽
C. Goldberg
◽
...
Keyword(s):
Thin Films
◽
Mechanical Characterization
◽
Dielectric Thin Films
◽
Low K
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Characterization of chemical-vapor-deposited low-k thin films using x-ray porosimetry
Applied Physics Letters
◽
10.1063/1.1553996
◽
2003
◽
Vol 82
(7)
◽
pp. 1084-1086
◽
Cited By ~ 16
Author(s):
Hae-Jeong Lee
◽
Eric K. Lin
◽
Barry J. Bauer
◽
Wen-li Wu
◽
Byung Keun Hwang
◽
...
Keyword(s):
Thin Films
◽
Chemical Vapor
◽
X Ray
◽
Chemical Vapor Deposited
◽
Low K
Download Full-text
Growth and characterization of MMA/SiO2 hybrid low-k thin films for interlayer dielectric applications
Bulletin of Materials Science
◽
10.1007/s12034-010-0030-z
◽
2010
◽
Vol 33
(3)
◽
pp. 197-201
◽
Cited By ~ 2
Author(s):
Bhavana N. Joshi
◽
M. A. More
◽
A. M. Mahajan
Keyword(s):
Thin Films
◽
Interlayer Dielectric
◽
Low K
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Hydrothermal synthesis, structure, and property characterization of rare earth silicate compounds: NaBa3Ln3Si6O20 (Ln = Y, Nd, Sm, Eu, Gd)
Solid State Sciences
◽
10.1016/j.solidstatesciences.2015.08.019
◽
2015
◽
Vol 48
◽
pp. 256-262
◽
Cited By ~ 10
Author(s):
Liurukara D. Sanjeewa
◽
Kyle Fulle
◽
Colin D. McMillen
◽
Fenglin Wang
◽
Yufei Liu
◽
...
Keyword(s):
Rare Earth
◽
Hydrothermal Synthesis
◽
Structure And Property
◽
Property Characterization
Download Full-text
Structural characterization of methylsilsesquioxane-based porous low-k thin films using X-ray porosimetry
Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695)
◽
10.1109/iitc.2003.1219725
◽
2004
◽
Author(s):
H.J. Lee
◽
C.L. Soles
◽
D.-W. Liu
◽
B.J. Bauer
◽
E.K. Lin
◽
...
Keyword(s):
Thin Films
◽
Structural Characterization
◽
X Ray
◽
Low K
Download Full-text
Development and characterization of fluorine tin oxide electrodes modified with high area porous thin films containing gold nanoparticles
Thin Solid Films
◽
10.1016/j.tsf.2010.07.126
◽
2010
◽
Vol 519
(1)
◽
pp. 487-493
◽
Cited By ~ 12
Author(s):
Carmen Quintana
◽
Pedro Atienzar
◽
Gerolamo Budroni
◽
Laura Mora
◽
Lucas Hernández
◽
...
Keyword(s):
Thin Films
◽
Gold Nanoparticles
◽
Tin Oxide
◽
Porous Thin Films
◽
Oxide Electrodes
◽
High Area
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Growth and optical property characterization of textured barium titanate thin films for photonic applications
Journal of Crystal Growth
◽
10.1016/j.jcrysgro.2006.11.313
◽
2007
◽
Vol 300
(2)
◽
pp. 330-335
◽
Cited By ~ 13
Author(s):
Matthew J. Dicken
◽
Kenneth Diest
◽
Young-Bae Park
◽
Harry A. Atwater
Keyword(s):
Thin Films
◽
Optical Property
◽
Barium Titanate
◽
Property Characterization
Download Full-text
Broadband Dielectric Spectroscopic Characterization of Thermal Stability of Low-k Dielectric Thin Films for Micro- and Nanoelectronic Applications
ECS Journal of Solid State Science and Technology
◽
10.1149/2.0141709jss
◽
2017
◽
Vol 6
(9)
◽
pp. N155-N162
◽
Cited By ~ 1
Author(s):
Christopher E. Sunday
◽
Karl R. Montgomery
◽
Papa K. Amoah
◽
Yaw S. Obeng
Keyword(s):
Thin Films
◽
Thermal Stability
◽
Spectroscopic Characterization
◽
Dielectric Thin Films
◽
Low K
◽
Thermal Stability Of
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