Genetic and silicon-induced resistance of sugarcane to Diatraea saccharalis (Lepidoptera: Crambidae) and silicon effect on nutrient accumulation

2021 ◽  
Author(s):  
Adriano Cirino Tomaz ◽  
Mateus Teles Vital Gonçalves ◽  
Cleiton Antônio Wartha ◽  
Nathalia Ferreira Papini ◽  
Angélica Fátima de Barros ◽  
...  
Keyword(s):  
Induced Resistance ◽  
Nutrient Accumulation ◽  
Diatraea Saccharalis

Efficient and Effective Failure Analysis of Low-Resistive Defect in Logic Device Using Layout-aware and Volume Diagnosis

2018 ◽  
Author(s):  
Ho Seok Song ◽  
Eun Ji Park ◽  
Tae Hwan Kim ◽  
Dong Hae Kang ◽  
Jong Taek Hong ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Induced Resistance ◽  
Logic Device ◽  
Electrical Isolation ◽  
Turn Around Time

Abstract Efficient and effective failure analysis (FA) of low-resistive defect was studied by using layout-aware and volume diagnosis. Small or marginal defect is one of the most difficult defectivities to identify during FA effort, especially if defect-induced resistance is not as high as the electrical isolation can detect. Here, we used new analysis methodologies, particularly using layout-aware and volume diagnosis, and prioritizing patterns in terms of a defective risk for following FA. The actual FA work verified that new analysis methodologies successfully identified low-resistive defect of Back-End-of-Line (BEOL) which was not detected by a conventional way and efficiently reduced the turn-around time (TAT) of physical failure analysis (PFA) by 57%, prompting fast feedback to fab.

Laser Failure Isolation Techniques Demonstrated On Test Structures

2008 ◽  
Author(s):  
Frank S. Arnold
Keyword(s):  
Integrated Circuits ◽  
Laser Beam ◽  
Case Studies ◽  
Induced Resistance ◽  
Simple Test ◽  
Resistance Change ◽  
Cross Sectional ◽  
Beam Focusing ◽  
Isolation Techniques ◽  
Heating Effects

Abstract To be better prepared to use laser based failure isolation techniques on field failures of complex integrated circuits, simple test structures without any failures can be used to study Optical Beam Induced Resistance Change (OBIRCH) results. In this article, four case studies are presented on the following test structures: metal strap, contact string, VIA string, and comb test structure. Several experiments were done to investigate why an OBIRCH image was seen in certain areas of a VIA string and not in others. One experiment showed the OBRICH variation was not related to the cooling and heating effects of the topology, or laser beam focusing. A 4 point probe resistance measurement and cross-sectional views correlated with the OBIRCH results and proved OBIRCH was able to detect a variation in VIA fabrication.

Induced resistance in tomato plants against root knot nematode using biotic and abiotic inducers

2016 ◽  
Vol 3 (11) ◽  
pp. 31-46 ◽  
Author(s):  
Abd El-Monem M.A. Sharaf ◽  
◽  
Atef M. Kailla ◽  
Mohamed S. Attia ◽  
Mohamed M. Nofal ◽  
...  
Keyword(s):  
Induced Resistance ◽  
Root Knot Nematode ◽  
Tomato Plants

Growth and Nutrient Accumulation and Distribution in Grain Sorghum. II. Zn, Cu, Fe, and Mn Uptake and Distribution 1

1975 ◽  
Vol 67 (5) ◽  
pp. 611-616 ◽  
Author(s):  
G. L. Jacques ◽  
R. L. Vanderlip ◽  
Roscoe Ellis
Keyword(s):  
Grain Sorghum ◽  
Nutrient Accumulation ◽  
Fe And Mn

Phomopsis Seed Infection and Nutrient Accumulation in Pods of Soybean with Reduced Fruit Loads

1988 ◽  
Vol 80 (1) ◽  
pp. 55-59 ◽  
Author(s):  
P. R. Thomison ◽  
D. L. Jeffers ◽  
A. F. Schmitthenner
Keyword(s):  
Seed Infection ◽  
Nutrient Accumulation
Sign in / Sign up

Export Citation Format

Share Document