Experimental Investigations of Supersonic Flow Over a Compression Ramp Based on Nanoparticle-Tracer-Based Planar Laser Scattering Technique

2016 ◽  
Vol 40 (2) ◽  
pp. 651-660 ◽  
Author(s):  
Y. Wu ◽  
S. Yi ◽  
L. He ◽  
Z. Chen ◽  
X. Wang
Keyword(s):  
Supersonic Flow ◽  
Experimental Investigations ◽  
Laser Scattering ◽  
Scattering Technique ◽  
Planar Laser ◽  
Compression Ramp

Detection of small concentrations of N2+ in the atmosphere by a laser scattering technique

1976 ◽  
Vol 47 (4) ◽  
pp. 1519-1522 ◽  
Author(s):  
Jerry E. Solomon ◽  
Dennis M. Silva
Keyword(s):  
Laser Scattering ◽  
Scattering Technique

scholarly journals Characteristics of Large-Scale Structures in Supersonic Planar Mixing Layer with Finite Thickness

2014 ◽  
Vol 6 ◽  
pp. 878679
Author(s):  
Hailong Zhang ◽  
Jiping Wu ◽  
Jian Chen ◽  
Weidong Liu
Keyword(s):  
High Speed ◽  
Large Scale ◽  
Finite Thickness ◽  
Mixing Layer ◽  
Mixing Enhancement ◽  
Laser Scattering ◽  
Large Scale Structures ◽  
Eddy Simulation ◽  
Planar Laser ◽  
Scale Structures

Nanoparticle-based planar laser scattering (NPLS) experiments and large eddy simulation (LES) were launched to get the fine structure of the supersonic planar mixing layer with finite thickness in the present study. Different from the turbulent development of supersonic planar mixing layer with thin thickness, the development of supersonic planar mixing layer with finite thickness is rapidly. The large-scale structures of mixing layer that possess the characters of quick movement and slow changes transmit to downriver at invariable speed. The transverse results show that the mixing layer is strip of right and dim and possess 3D characteristics. Meanwhile the vortices roll up from two sides to the center. Results indicate that the higher the pressure of the high speed side is, the thicker the mixing layer is. The development of mixing layer is restrained when the pressure of lower speed side is higher. The momentum thickness goes higher with the increase of the clapboard thickness. Through increasing the temperature to change the compression can affect the development of the vortices. The present study can make a contribution to the mixing enhancement and provide initial data for the later investigations.

Improved Defect Classification Techniques of a Laser Scattering Detection System for Post CMP Silicon Dioxide Wafers

2007 ◽  
Vol 991 ◽  
Author(s):  
Daniel Mateja ◽  
Toshi Kasai ◽  
Michael Denham ◽  
Haresh Siriwardane
Keyword(s):  
Light Scattering ◽  
Silicon Dioxide ◽  
Laser Light ◽  
Detection System ◽  
Incident Beam ◽  
Experimental Conditions ◽  
Laser Scattering ◽  
Scattering Geometry ◽  
Scattering Technique ◽  
Light Scattering Technique

ABSTRACTA laser light scattering technique was used for the identification of defects on silicon dioxide (SiO2) wafers polished with a tungsten CMP slurry. Defects were then classified as scratches and particles using scanning electron microscopy (SEM). The effects of the incident beam illumination and scattering geometry on the defect detection are examined. Appropriate experimental conditions for selective detection of scratches and particles are discussed in conjunction with the estimated defect count and fractional ratio for specific defect types and sizes. The findings are qualitatively consistent with predicted light scattering distributions simulated from silicon bare substrates.

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