Determination of electron work function in solids by a vibrating condenser method

1962 ◽  
Vol 1 (5) ◽  
pp. 488
Author(s):  
I MOROZOVA
2006 ◽  
Vol 51 (12) ◽  
pp. 1627-1629
Author(s):  
B. B. Alchagirov ◽  
B. S. Karamurzov ◽  
T. A. Sizhazhev ◽  
T. M. Taova ◽  
R. Kh. Arkhestov

2004 ◽  
Vol 11 (02) ◽  
pp. 173-178 ◽  
Author(s):  
WEN LI ◽  
D. Y. LI

The Kelvin probe is a sophisticated instrument which is very sensitive to changes in surface conditions, such as deformation, texture, phase transformation and contamination. Efforts have been made to use this technique to diagnose wear. In this study, the effect of the grain boundary (GB) on the electron work function (EWF) was examined with the aim of investigating the contribution of changes in grain size to total changes in the EWF during wear. Copper and aluminum were studied as examples. It was demonstrated that the EWF dropped in the vicinity of GB's and the mean EWF decreased as the grain size decreased. The mechanism responsible for the changes in the EWF with respect to the GB is discussed.


1972 ◽  
Vol 27 (5) ◽  
pp. 794-803 ◽  
Author(s):  
R Müller ◽  
W Walcher ◽  
H.-W Wassmuth

AbstractThree methods for the measurement of the change ΔΦ of the work function Φ of a metal surface due to the presence of adsorbed particles (e. g. oxygen) have been developed utilizing the surface ionization of a beam of metal atoms (e. g. In, Sr) as a probe. The experiments have been performed with a mass spectrometer at ultrahigh vacuum.In the first method the temperature dependency of the ion emission current is used for the determination of the work function Φ considering certain limiting conditions. The two other methods which may be applied simultaneously with the first one, involve a direct measurement of ΔΦ by compensating the change of the contact potential by an external voltage: In the second method the contact potential between the ionizing surface and a surrounding reference electrode is used to control the ion optical conditions for the ion emission, whereas in the third method the change in the kinetic energy of the ions caused by a change of the contact potential between the ionizing surface and the entrance slit of the mass spectrometer is used as a measure of ΔΦ


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