Growth of Si-doped AlxGa1–xN on (0001) sapphire substrate by metalorganic vapor phase epitaxy

1991 ◽  
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Nobuhiko Sawaki ◽  
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1997 ◽  
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Fumitsugu Fukuyo ◽  
Tomoyuki Okada ◽  
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Shigefusa F. Chichibu ◽  
Hideto MIYAKE ◽  
Akira Uedono

Abstract To give a clue for increasing emission efficiencies of Al x Ga1-x N-based deep ultraviolet light emitters, the origins and influences on carrier concentration and minority carrier lifetime (τminority), which determines the internal quantum efficiency, of midgap recombination centers in c-plane Si-doped Al0.60Ga0.40N epilayers and Al0.68Ga0.32N quantum wells (QWs) grown by metalorganic vapor phase epitaxy were studied by temporally and spatially resolved luminescence measurements, making a correlation with the results of positron annihilation measurement. For the Al0.60Ga0.40N epilayers, τminority decreased as the concentration of cation vacancies (VIII) increased, indicating that VIII, most probably decorated with nitrogen vacancies (VN), VIII(VN) n , are major nonradiative recombination centers (NRCs). For heavily Si-doped Al0.60Ga0.40N, a generation of electron-compensating complexes (VIII-SiIII) is suggested. For lightly Si-doping regime, τminority of the QW emission was increased by appropriate Si-doping in the wells, which simultaneously increased the terrace width. The importance of wetting conditions is suggested for decreasing the NRC concentration.


2007 ◽  
Vol 46 (2) ◽  
pp. 555-559 ◽  
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Masahiro Araki ◽  
Noriaki Mochimizo ◽  
Katsuyuki Hoshino ◽  
Kazuyuki Tadatomo

1993 ◽  
Vol 74 (2) ◽  
pp. 1327-1330 ◽  
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Kazushige Shiina ◽  
Tatsuya Ohori ◽  
Kazumi Kasai ◽  
Junji Komeno

2003 ◽  
Vol 42 (Part 1, No. 12) ◽  
pp. 7284-7289 ◽  
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Ashraful Ghani Bhuiyan ◽  
Tatsuya Tanaka ◽  
Ken Kasashima ◽  
Akihiro Hashimoto ◽  
Akio Yamamoto

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