Electrical characterization of metal-oxide-InP tunnel diodes based on current-voltage, admittance and low frequency noise measurements
1995 ◽
Vol 38
(5)
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pp. 1035-1043
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2013 ◽
Vol 34
(11)
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pp. 1403-1405
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2001 ◽
Vol 16
(4)
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pp. 233-238
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1989 ◽
Vol 32
(12)
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pp. 1551-1555
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