Calculations of ionization rate-constants for the field-ion microscope

1992 ◽  
Vol 277 (3) ◽  
pp. 359-369 ◽  
Author(s):  
S.C. Lam ◽  
R.J. Needs
2020 ◽  
Vol 12 ◽  
pp. 5-10
Author(s):  
Ariel Almeida Abreu Silva ◽  
A.V. Andrade-Neto

In this work we describe calculations of tunneling rate constants for the Field Ion Microscope (FIM) using one-dimensional model potential that simulates the ionization process in a FIM. We obtain expressions for the ionization rate constant (ionization probability per unit of time) of inert gas atoms as a function of their position above the surface. In order to calculate the probability of barrier penetration we have used the semiclassical (JWKB) approximation. We have also calculated ionization zone widths as the distance between points where ionization rate is a maximum and half of this value. An application to helium as the imaging gas is presented to highlight the power of the method.


1963 ◽  
Vol 39 (10) ◽  
pp. 2558-2564 ◽  
Author(s):  
Tj. Hollander ◽  
P. J. Kalff ◽  
C. T. J. Alkemade

1988 ◽  
Vol 37 (9) ◽  
pp. 3259-3269 ◽  
Author(s):  
Douglas J. Bamford ◽  
Roberta P. Saxon ◽  
Leonard E. Jusinski ◽  
Jesse D. Buck ◽  
William K. Bischel

2019 ◽  
Vol 54 (5) ◽  
pp. 422-428
Author(s):  
Rafal  S. Strekowski ◽  
Coralie Alvarez ◽  
Jeanne Petrov-Stojanović ◽  
Denis Hagebaum-Reignier ◽  
Henri Wortham

Author(s):  
O. T. Inal ◽  
L. E. Murr

When sharp metal filaments of W, Fe, Nb or Ta are observed in the field-ion microscope (FIM), their appearance is differentiated primarily by variations in regional brightness. This regional brightness, particularly prominent at liquid nitrogen temperature has been attributed in the main to chemical specificity which manifests itself in a paricular array of surface-atom electron-orbital configurations.Recently, anomalous image brightness and streaks in both fcc and bee materials observed in the FIM have been shown to be the result of surface asperities and related topographic features which arise by the unsystematic etching of the emission-tip end forms.


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