The variation in the luminescent and structural properties of sputter-deposited ZnS:Mn thin films with post-deposition annealing

1982 ◽  
Vol 92 (3) ◽  
pp. 211-217 ◽  
Author(s):  
A.F. Cattell ◽  
A.G. Cullis
2001 ◽  
Vol 670 ◽  
Author(s):  
Akira Nishiyama ◽  
Akio Kaneko ◽  
Masato Koyama ◽  
Yoshiki Kamata ◽  
Ikuo Fujiwara ◽  
...  

ABSTRACTTi-Si-O films were sputter deposited from TiO2+SiO2 composite targets with various SiO2 content. The phase separation occurred for every SiO2 content used in this experiment (from 14% to 75%) and it has been revealed that nanocrystalline (TiO2)1-x(SiO2)x films in which anatase TiO2 forms tiny grains were obtained when x in the film is larger than 0.26. The tiny grain was effective for suppressing the thermal grooving phenomenon of the thin films by the post deposition annealing which leads to the leakage current increase. The dielectric constant of the nanocrystalline film was varied with the SiO2 content from the value of the bulk anatase to SiO2.


2011 ◽  
Vol 520 (1) ◽  
pp. 110-116 ◽  
Author(s):  
Kazuhiro Kato ◽  
Hideo Omoto ◽  
Takao Tomioka ◽  
Atsushi Takamatsu

2009 ◽  
Author(s):  
Wei-En Fu ◽  
Yong-Qing Chang ◽  
Yi-Ching Chen ◽  
Erik M. Secula ◽  
David G. Seiler ◽  
...  

2017 ◽  
Vol 30 (1) ◽  
pp. 1-5
Author(s):  
Young-Hwan Song ◽  
Tae-Young Eom ◽  
Sung-Bo Heo ◽  
Jun-Ho Kim ◽  
Daeil Kim

2018 ◽  
Vol 5 (6) ◽  
pp. 064004
Author(s):  
R Bakiya Lakshmi ◽  
A Vimala Juliet ◽  
Anuraj Sundararaj ◽  
E Meher Abhinav ◽  
Gopalakrishnan Chandrasekaran

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