Preparation and characterization of a new high quality polymer thin film from citral

1984 ◽  
Vol 122 (3) ◽  
pp. 197-202 ◽  
Author(s):  
S. Jayalekshmi ◽  
M.G. Krishna Pillai
Keyword(s):  
Thin Film ◽  
High Quality ◽  
Polymer Thin Film

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

Semiconductor Quantum Dot/Polymer Thin Film Based Hydrocarbon Sensor: Characterization of Sensing Properties

2007 ◽  
Author(s):  
Zhouying Zhao ◽  
Mayrita Arrandale ◽  
Michael A. Carpenter ◽  
Oxana Vassiltsova ◽  
Marina A. Petrukhina
Keyword(s):  
Thin Film ◽  
Quantum Dot ◽  
Polymer Thin Film ◽  
Sensing Properties ◽  
Semiconductor Quantum Dot

scholarly journals Characterization of Rapid Melt Growth (RMG) Process for High Quality Thin Film Germanium on Insulator

2012 ◽  
Vol 45 (4) ◽  
pp. 169-180 ◽  
Author(s):  
N. Zainal ◽  
S. J. N. Mitchell ◽  
D. W. McNeill ◽  
M. F. Bain ◽  
B. M. Armstrong ◽  
...  
Keyword(s):  
Thin Film ◽  
High Quality ◽  
Melt Growth

Characterization of bias stress induced electrical instability in liquid-crystalline semiconducting polymer thin-film transistors

2011 ◽  
Vol 110 (8) ◽  
pp. 084511 ◽  
Author(s):  
Jiyoul Lee ◽  
Do Hwan Kim ◽  
Bang-Lin Lee ◽  
Jeong-Il Park ◽  
Byungwook Yoo ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Liquid Crystalline ◽  
Polymer Thin Film ◽  
Semiconducting Polymer ◽  
Bias Stress ◽  
Electrical Instability
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