Characterization of thermal and deposited thin oxide layers by longitudinal optical-transverse optical excitation in fourier transform IR transmission measurements

1989 ◽  
Vol 174 ◽  
pp. 159-164 ◽  
Author(s):  
P. Lange ◽  
W. Windbracke
Keyword(s):  
Fourier Transform ◽  
Optical Excitation ◽  
Longitudinal Optical ◽  
Transverse Optical ◽  
Oxide Layers ◽  
Ir Transmission ◽  
Fourier Transform Ir ◽  
Transmission Measurements ◽  
Thin Oxide

Detection and characterization of silicon nanocrystals embedded in thin oxide layers

2004 ◽  
Vol 95 (1) ◽  
pp. 257-262 ◽  
Author(s):  
M. Perego ◽  
S. Ferrari ◽  
M. Fanciulli ◽  
G. Ben Assayag ◽  
C. Bonafos ◽  
...  
Keyword(s):  
Silicon Nanocrystals ◽  
Oxide Layers ◽  
Thin Oxide

Formation and Characterization of Thin Oxide Layers on the Spatially Controlled Atomic-Step-Free Si(001) Surface

1998 ◽  
Vol 37 (Part 1, No. 4A) ◽  
pp. 1680-1683 ◽  
Author(s):  
Atsushi Ando ◽  
Kunihiro Sakamoto ◽  
Kazushi Miki ◽  
Kazuhiko Matsumoto ◽  
Tsunenori Sakamoto
Keyword(s):  
Atomic Step ◽  
Oxide Layers ◽  
Thin Oxide

Characterization of thin oxide layers by use of the atomic force acoustic microscopy

2008 ◽  
Author(s):  
Andre Striegler ◽  
Malgorzata Kopycinska-Mueller ◽  
Bernd Koehler ◽  
Klaus-Juergen Wolter ◽  
Norbert Meyendorf
Keyword(s):  
Acoustic Microscopy ◽  
Oxide Layers ◽  
Atomic Force ◽  
Thin Oxide
Sign in / Sign up

Export Citation Format

Share Document