Preparation and characterization of thin polymer bilayer films by neutron reflection

1991 ◽  
Vol 202 (2) ◽  
pp. 345-350 ◽  
Author(s):  
A. Karim ◽  
B.H. Arendt ◽  
G.P. Felcher ◽  
T.P. Russell
1989 ◽  
Author(s):  
L. L. Kosbar ◽  
S. W. J. Kuan ◽  
C. W. Frank ◽  
R. F. W. Pease
Keyword(s):  

2001 ◽  
Vol 707 ◽  
Author(s):  
Ian C. Bache ◽  
Catherine M. Ramsdale ◽  
D. Steve Thomas ◽  
Ana-Claudia Arias ◽  
J. Devin MacKenzie ◽  
...  

ABSTRACTCharacterising the morphology of thin films for use in device applications requires the ability to study both the structure within the plane of the film, and also through its thickness. Environmental scanning electron microscopy has proved to be a fruitful technique for the study of such films both because contrast can be seen within the film without the need for staining (as is conventionally done for electron microscopy), and because cross-sectional images can be obtained without charging artefacts. The application of ESEM to a particular blend of relevance to photovoltaics is described.


2009 ◽  
Vol 517 (15) ◽  
pp. 4348-4354 ◽  
Author(s):  
Junlong Song ◽  
Jing Liang ◽  
Xiaomeng Liu ◽  
Wendy E. Krause ◽  
Juan P. Hinestroza ◽  
...  

Author(s):  
Yang Li ◽  
Guoxun Zeng ◽  
Qibai Wu ◽  
Haiyan Zhang ◽  
Wenwu Li ◽  
...  
Keyword(s):  

2006 ◽  
Vol 77 (10) ◽  
pp. 104901 ◽  
Author(s):  
Hironori Tohmyoh ◽  
Takuya Imaizumi ◽  
Masumi Saka

1991 ◽  
Vol 94 (4) ◽  
pp. 3235-3241 ◽  
Author(s):  
M. Abraham ◽  
J. Dütting ◽  
M. Schreck ◽  
R. Lege ◽  
S. Reich ◽  
...  

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