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Depth microscopy for thin film analysis
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
◽
10.1016/0168-9002(93)90549-w
◽
1993
◽
Vol 334
(1)
◽
pp. 187-190
◽
Cited By ~ 9
Author(s):
G. Dollinger
◽
M. Boulouednine
◽
T. Faestermann
◽
P. Maier-Komor
Keyword(s):
Thin Film
◽
Film Analysis
◽
Thin Film Analysis
Download Full-text
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References
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
10.3403/30206251
◽
2013
◽
Keyword(s):
Thin Film
◽
Chemical Analysis
◽
Photoelectron Spectroscopy
◽
Surface Chemical
◽
Film Analysis
◽
X Ray
◽
Thin Film Analysis
◽
Surface Chemical Analysis
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Acquisition of Surface/Thin Film Analysis System
10.21236/ada402919
◽
2002
◽
Author(s):
James Stoffer
◽
George D. Weddill
◽
Thomas O'Keefe
◽
Richard Brow
◽
Matt O'Keefe
Keyword(s):
Thin Film
◽
Film Analysis
◽
Thin Film Analysis
◽
Analysis System
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Applications of microfocussed ion beams in surface and thin film analysis
Vacuum
◽
10.1016/0042-207x(87)90011-x
◽
1987
◽
Vol 37
(3-4)
◽
pp. 289-291
◽
Cited By ~ 4
Author(s):
RE Thurstans
◽
J Wolstenholme
Keyword(s):
Thin Film
◽
Ion Beams
◽
Film Analysis
◽
Thin Film Analysis
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Atomic force microscopy for thin film analysis
Surface and Coatings Technology
◽
10.1016/0257-8972(94)90251-8
◽
1994
◽
Vol 68-69
◽
pp. 770-775
◽
Cited By ~ 11
Author(s):
Roger W. Phillips
Keyword(s):
Thin Film
◽
Atomic Force Microscopy
◽
Film Analysis
◽
Force Microscopy
◽
Thin Film Analysis
◽
Atomic Force
Download Full-text
MULTILAYER THIN‐FILM ANALYSIS BY ION BACKSCATTERING
Applied Physics Letters
◽
10.1063/1.1653620
◽
1971
◽
Vol 18
(5)
◽
pp. 191-194
◽
Cited By ~ 28
Author(s):
S. T. Picraux
◽
F. L. Vook
Keyword(s):
Thin Film
◽
Multilayer Thin Film
◽
Film Analysis
◽
Thin Film Analysis
◽
Ion Backscattering
Download Full-text
Thin film analysis of gadolinium iron oxide and gadolinium iron by a combined ion exchange X-ray fluorescence method
Microchimica Acta
◽
10.1007/bf01216925
◽
1968
◽
Vol 56
(4)
◽
pp. 827-832
◽
Cited By ~ 2
Author(s):
I. C. Barlow
◽
R. K. Van Valkenburg
Keyword(s):
Thin Film
◽
Iron Oxide
◽
Ion Exchange
◽
Fluorescence Method
◽
Film Analysis
◽
X Ray
◽
Thin Film Analysis
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Significance of the channeling surface peak in thin‐film analysis
Applied Physics Letters
◽
10.1063/1.89948
◽
1978
◽
Vol 32
(2)
◽
pp. 93-94
◽
Cited By ~ 17
Author(s):
Robert L. Kauffman
◽
L. C. Feldman
◽
P. J. Silverman
◽
R. A. Zuhr
Keyword(s):
Thin Film
◽
Film Analysis
◽
Thin Film Analysis
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Surface and Thin Film Analysis of Metals and Semiconductors Using X-Ray Photoelectron Spectroscopy
Advances in X-Ray Analysis
◽
10.1007/978-1-4615-3460-0_24
◽
1992
◽
pp. 883-897
◽
Cited By ~ 1
Author(s):
S. Hofmann
Keyword(s):
Thin Film
◽
Photoelectron Spectroscopy
◽
Film Analysis
◽
X Ray
◽
Thin Film Analysis
Download Full-text
Resolving Common Element Problem by Using Different Lines in Fundamental Parameters Method Multilayer Thin Film Analysis
Advances in X-Ray Analysis
◽
10.1007/978-1-4615-2528-8_28
◽
1994
◽
pp. 213-218
Author(s):
Liangyuan Feng
Keyword(s):
Thin Film
◽
Common Element
◽
Multilayer Thin Film
◽
Film Analysis
◽
Fundamental Parameters
◽
Thin Film Analysis
Download Full-text
A Simple Approach to Multilayer Thin Film Analysis Based on Theoretical Calculations using Fundamental Parameters Method
Advances in X-Ray Analysis
◽
10.1007/978-1-4615-2972-9_33
◽
1993
◽
pp. 279-286
Author(s):
Liangyuan Feng
Keyword(s):
Thin Film
◽
Theoretical Calculations
◽
Simple Approach
◽
Multilayer Thin Film
◽
Film Analysis
◽
Fundamental Parameters
◽
Thin Film Analysis
Download Full-text
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