Characterization of surface defects and determination of overlayer nucleation and growth by surface-sensitive diffraction
1986 ◽
Vol 26
(4)
◽
pp. 418-430
◽
2005 ◽
Vol 20
(12)
◽
pp. 3278-3293
◽
1983 ◽
Vol 41
◽
pp. 270-271
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2018 ◽