Determination of atomic scattering factors of vanadium and chromium by means of vanishing Kikuchi line method

1972 ◽  
Vol 41 (2) ◽  
pp. 159-160 ◽  
Author(s):  
M. Fujimoto ◽  
O. Terasaki ◽  
D. Watanabe
Keyword(s):  
Kikuchi Line ◽  
Line Method ◽  
Atomic Scattering

Determination of the structure factors of Cu and Cu3Au by the intersecting Kikuchi-line method

1984 ◽  
Vol 40 (6) ◽  
pp. 544-549 ◽  
Author(s):  
H. Matsuhata ◽  
Y. Tomokiyo ◽  
H. Watanabe ◽  
T. Eguchi
Keyword(s):  
Kikuchi Line ◽  
Line Method ◽  
Structure Factors

The determination of the stoichiometry and stability constant of weak complexes in solution: a restatement of the "straight-line" method

1983 ◽  
Vol 61 (6) ◽  
pp. 1100-1102 ◽  
Author(s):  
Aurelio Beltrán-Porter ◽  
José A. Ramírez
Keyword(s):  
Stability Constant ◽  
Stoichiometric Ratio ◽  
Complex Species ◽  
Line Method ◽  
Straight Line ◽  
Weak Complexes ◽  
The Stability ◽  
Degree Of Condensation ◽  
Straight Line Method

Usually, to establish the degree of condensation of a complex species in solution, primarily when it is a weak complex, is more cumbersome than to determine the stoichiometric ratio itself. The present work describes a modification of the Asmus method in order to render it suitable for the determination of the actual stoichiometric coefficients and the stability constant of weak complexes whatever the degree of condensation may be.

scholarly journals Quantitative anomalous powder diffraction analysis of cation disorder in kesterite semiconductors

2016 ◽  
Vol 31 (3) ◽  
pp. 168-175 ◽  
Author(s):  
Daniel M. Többens ◽  
Rene Gunder ◽  
Galina Gurieva ◽  
Julien Marquardt ◽  
Kai Neldner ◽  
...  
Keyword(s):  
Structural Parameters ◽  
Photovoltaic Properties ◽  
Copper And Zinc ◽  
Cation Disorder ◽  
Zn Distribution ◽  
Atomic Scattering ◽  
Diffraction Patterns ◽  
X Ray Absorption ◽  
Direct Dependency

Kesterite-type compound semiconductors, containing copper and zinc, have photovoltaic properties depending on cation distribution in the crystal structure. Anomalous diffraction allows discrimination of isoelectronic cations, in principle allowing a straightforward determination of site occupation factors from data collected at multiple energies close to the X-ray absorption edges of copper and zinc. However, extremely strong correlation between structural parameters precludes this. We present a recipe based on the direct dependency between refined occupation factors and atomic scattering power, which allows to lift the correlations and to detect issues of individual diffraction patterns or assumptions in the model, thereby allowing for reliable quantitative analysis of the Cu/Zn distribution.

Determination of Atomic Scattering Factors of B.C.C. Metals by the Critical-Voltage Method

1975 ◽  
Vol 39 (5) ◽  
pp. 1277-1281 ◽  
Author(s):  
Osamu Terasaki ◽  
Yūji Uchida ◽  
Denjiro Watanabe
Keyword(s):  
Critical Voltage ◽  
Atomic Scattering
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