Determination of Atomic Scattering Factors of B.C.C. Metals by the Critical-Voltage Method

1975 ◽  
Vol 39 (5) ◽  
pp. 1277-1281 ◽  
Author(s):  
Osamu Terasaki ◽  
Yūji Uchida ◽  
Denjiro Watanabe
Keyword(s):  
Critical Voltage ◽  
Atomic Scattering

scholarly journals Quantitative anomalous powder diffraction analysis of cation disorder in kesterite semiconductors

2016 ◽  
Vol 31 (3) ◽  
pp. 168-175 ◽  
Author(s):  
Daniel M. Többens ◽  
Rene Gunder ◽  
Galina Gurieva ◽  
Julien Marquardt ◽  
Kai Neldner ◽  
...  
Keyword(s):  
Structural Parameters ◽  
Photovoltaic Properties ◽  
Copper And Zinc ◽  
Cation Disorder ◽  
Zn Distribution ◽  
Atomic Scattering ◽  
Diffraction Patterns ◽  
X Ray Absorption ◽  
Direct Dependency

Kesterite-type compound semiconductors, containing copper and zinc, have photovoltaic properties depending on cation distribution in the crystal structure. Anomalous diffraction allows discrimination of isoelectronic cations, in principle allowing a straightforward determination of site occupation factors from data collected at multiple energies close to the X-ray absorption edges of copper and zinc. However, extremely strong correlation between structural parameters precludes this. We present a recipe based on the direct dependency between refined occupation factors and atomic scattering power, which allows to lift the correlations and to detect issues of individual diffraction patterns or assumptions in the model, thereby allowing for reliable quantitative analysis of the Cu/Zn distribution.

Comments on ``Determination of Atomic Scattering Factors''

1960 ◽  
Vol 31 (6) ◽  
pp. 1130-1131 ◽  
Author(s):  
D. R. Chipman ◽  
Arthur Paskin
Keyword(s):  
Atomic Scattering

scholarly journals A Summary of Low-angle X-ray Atomic Scattering Factors Measured by the Critical Voltage Effect in High Energy Electron Diffraction

1988 ◽  
Vol 41 (3) ◽  
pp. 461 ◽  
Author(s):  
AG Fox ◽  
RM Fisher
Keyword(s):  
Electron Diffraction ◽  
Form Factors ◽  
High Energy ◽  
Energy Electron ◽  
Free Atom ◽  
Critical Voltage ◽  
High Energy Electron ◽  
X Ray ◽  
Hexagonal Close Packed ◽  
Atomic Scattering

A summary of all the accurate (-0.1%) low-angle X-ray atomic scattering (form) factors for cubic and hexagonal close-packed elements which have been determined by the critical voltage technique in high energy electron diffraction (HEED) is presented. For low atomic number elements (Z ~ 40) the low-angle form factors can be significantly different to best free atom values, and so the best band structure calculated and/or X-ray measured form factors consistent with the critical voltage measurements are also indicated. At intermediate atomic numbers (Z:::: 40-50) only the very low-angle form factors appear to be different to the best free atom values, and even then only by small amounts. For heavy elements (Z ~ 70) the best free atom form factors appear to agree very closely with the critical voltage measured values and so, in this case, critical voltage measurements allow accurate determinations of Debye-Waller factors.

The determination of the atomic scattering factor of germanium by a Pendellösung method

1970 ◽  
Vol 26 (5) ◽  
pp. 514-518 ◽  
Author(s):  
E. Persson ◽  
E. Zielińska-Rohozińska ◽  
L. Gerward
Keyword(s):  
Atomic Scattering Factor ◽  
Atomic Scattering ◽  
Scattering Factor
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