A checklist of suggested safe practices for the storage, distribution, use and disposal of toxic and hazardous gases in photovoltaic cell production

Solar Cells ◽  
1991 ◽  
Vol 31 (6) ◽  
pp. 513-525 ◽  
Author(s):  
P.D. Moskowitz ◽  
V.M. Fthenakis
Solar Energy ◽  
2016 ◽  
Vol 133 ◽  
pp. 283-293 ◽  
Author(s):  
Jinglan Hong ◽  
Wei Chen ◽  
Congcong Qi ◽  
Liping Ye ◽  
Changqing Xu

2021 ◽  
Vol 1209 (1) ◽  
pp. 012027
Author(s):  
M Vácha ◽  
J Kodymová ◽  
V Lapčík

Abstract A number of articles have already been published on energy recovery from the sun using solar panels and their environmental impacts. However, in this article, we assess the impact of solar panel technology, and use separately obtained data based on the disassembly of a specific photovoltaic panel into discrete parts. The aim of this article is to list all the environmental impacts of this panel per unit of energy produced and at the same time to focus primarily on deciphering the energy intensity of individual phases of the life cycle of photovoltaic panel production. An analytical method of Life-cycle assessment using the environmental software version SimaPro 9.0.049 with an integrated Ecoinvent 3 database was used to determine the environmental impacts. Throughout the work, we focus on the data obtained, which shows that the process of photovoltaic panel production itself is very energy-intensive, especially in the phase of photovoltaic cell production and solar glass production. In other phases, which is the production of individual parts of the photovoltaic panel, its use, and subsequent recycling, they do not contribute so much to the overall energy balance. In the environmental impact assessment, the most affected aspects were human health, followed by climatic change, resources, and the ecosystem quality came last. In all four of the above categories, the influence of the photovoltaic cell production phase was determined to be dominant.


Author(s):  
Ramachandra Chitakudige ◽  
Sarat Kumar Dash ◽  
A.M. Khan

Abstract Detection of both Insufficient Buried Contact (IBC) and cell-to-cell short defects is quite a challenging task for failure analysis in submicron Dynamic Random Access Memory (DRAM) devices. A combination of a well-controlled wet etch and high selectivity poly silicon etch is a key requirement in the deprocessing of DRAM for detection of these types of failures. High selectivity poly silicon etch methods have been reported using complicated system such as ECR (Electron Cyclotron Resonance) Plasma system. The fact that these systems use hazardous gases like Cl2, HBr, and SF6 motivates the search for safer alternative deprocessing chemistries. The present work describes high selectivity poly silicon etch using simple Reactive Ion Etch (RIE) plasma system using less hazardous gases such as CF4, O2 etc. A combination of controlled wet etch and high selectivity poly silicon etch have been used to detect both IBC and cell-to-cell shorts in submicron DRAMs.


2020 ◽  
Vol 3 (441) ◽  
pp. 6-14
Author(s):  
Z.A. Estemesov ◽  
◽  
A.V. Barvinov ◽  
B.K. Sarsenbaev ◽  
A.A. Tulaganov ◽  
...  
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