Convergent beam electron diffraction zone axis pattern maps from a copper single crystal

1993 ◽  
Vol 31 (2) ◽  
pp. 83-90 ◽  
Author(s):  
E.G. Silva
Author(s):  
E. Silva ◽  
R. Scozia

The purpose in obtaining zone axis pattern map (zap map) from a given material is to provide a quick and reliable tool to identify cristaline phases, and crystallographic directions, even in small particles. Bend contours patterns and Kossel lines patterns maps from Zr single crystal in the [0001] direction have been presented previously. In the present communication convergent beam electron diffraction (CBED) zap map of Zr will be shown. CBED patterns were obtained using a Philips microscope model EM300, which was set up to carry out this technique. Convergent objective upper pole piece for STEM and some electronic modifications in the lens circuits were required, furthermore the microscope was carefully cleaned and it was operated at a vacuum eminently good.CBED patterns in the Zr zap map consist of zero layer disks, showing fine details within them which correspond to intersecting set of higher order Laue zone (HOLZ) deficiency lines.


2011 ◽  
Vol 1295 ◽  
Author(s):  
X. H. Sang ◽  
A. Kulovits ◽  
J. Wiezorek

ABSTRACTAccurate Debye-Waller (DW) factors of chemically ordered β-NiAl (B2, cP2, ${\rm{Pm}}\bar 3 {\rm{m}}$) have been measured at different temperatures using an off-zone axis multi-beam convergent beam electron diffraction (CBED) method. We determined a cross over temperature below which the DW factor of Ni becomes smaller than that of Al of ~90K. Additionally, we measured for the first time DW factors and structure factors of chemically ordered γ1-FePd (L10, tP2, P4/mmm) at 120K. We were able to simultaneously determine all four anisotropic DW factors and several low order structure factors using different special off-zone axis multi-beam convergent beam electron diffraction patterns with high precision and accuracy. An electron charge density deformation map was constructed from measured X-ray diffraction structure factors for γ1-FePd.


2007 ◽  
Vol 40 (2) ◽  
pp. 241-249 ◽  
Author(s):  
Haruyuki Inui ◽  
Akihiro Fujii ◽  
Hiroki Sakamoto ◽  
Satoshi Fujio ◽  
Katsushi Tanaka

The recently proposed CBED (convergent-beam electron diffraction) method for enantiomorph identification has been successfully applied to crystals belonging to the point groups 321 and 312. The intensity asymmetry of zeroth-order Laue zone and/or first-order Laue zone reflections of Bijvoet pairs is easily recognized in CBED patterns with the incidence along appropriate zone-axis orientations for each member of the enantiomorphic pair. The intensity asymmetry with respect to the symmetry line is reversed upon changing the space group (handedness) from one to the other. Thus, enantiomorph identification can be easily performed in principle for all crystals belonging to the point groups 321 and 312.


2015 ◽  
Vol 48 (3) ◽  
pp. 736-746 ◽  
Author(s):  
Katsushi Tanaka ◽  
Norihiko L. Okamoto ◽  
Satoshi Fujio ◽  
Hiroki Sakamoto ◽  
Haruyuki Inui

A convergent-beam electron diffraction (CBED) method is proposed for polarity determination, in which polarity is determined from the intensity asymmetry of any of thehkl–\overline h\overline k\overline l Friedel pairs appearing in a zone-axis CBED pattern with a symmetric arrangement of Bijvoet pairs of reflections. The intensity asymmetry occurs as a result of multiple scattering among Bijvoet pairs of reflections in the CBED pattern. The appropriate zone-axis orientations for polarity determination are deduced for 19 of the 25 polar point groups from symmetry considerations so as to observe Bijvoet pairs of reflections symmetrically in a single CBED pattern. These appropriate zone-axis orientations deduced for the 19 polar point groups coincide with nonpolar directions. This is because the nonpolar directions for these point groups are perpendicular to an even-fold rotation axis, which guarantees the symmetric arrangement of Bijvoet pairs of reflections with respect to the symmetry (m–m′) line in a CBED pattern taken along any of the appropriate zone-axis orientations. Them–m′ line in the CBED pattern is proved to be perpendicular to the trace of the even-fold rotation axis. On the other hand, if the nonpolar direction is either perpendicular to a mirror plane or parallel to a roto-inversion axis as in the four point groupsm, 3m1, 31m, \overline 6, the nonpolar direction cannot be used as the appropriate zone-axis orientation for polarity determination because the Bijvoet pairs of reflections are not arranged symmetrically in the CBED pattern. The validity of the CBED method is confirmed both by experiment and by calculation of CBED patterns.


Sign in / Sign up

Export Citation Format

Share Document