Ion mobility spectrometry of explosives, the stability of gas phase ions, and prospectives for future explosive trace detectors

2022 ◽  
pp. 1-28
Author(s):  
G.A. Eiceman ◽  
R. Rajapakse ◽  
J.A. Stone
2021 ◽  
Author(s):  
Roberto Fernandez-Maestre ◽  
Martha Cecilia Daza

In ion mobility spectrometry (IMS), reduced mobility (K0) is an identification parameter of gas-phase ions but, frequently, these values are different whether there is contamination with moisture and other volatile...


2007 ◽  
Vol 61 (10) ◽  
pp. 1076-1083 ◽  
Author(s):  
G. A. Eiceman ◽  
D. Young ◽  
H. Schmidt ◽  
J. E. Rodriguez ◽  
J. I. Baumbach ◽  
...  

A mobility spectrometer was used to characterize gas-phase ions produced from laser ablation of solids in air at 100 °C and at ambient pressure with a beam focused to a diameter of <0.2 mm at energy of 6 mJ/pulse and wavelength of 266 nm. Metals, organic polymers, glass, graphite, and boron nitride exhibited characteristic mobility spectra with peaks at drift times between 8.75 and 12.5 ms (reduced mobility values of 2.19 to 1.53 cm2/Vs). Ion intensities increased initially and then decreased with repeated laser shots through drilling of the solid, and persistence of signal was proportional to hardness. A single comparatively narrow peak for negative ions was observed in mobility spectra for all materials and this was mass-identified as O2−. These ions were formed in air from reactions of oxygen with electrons emitted from the ablation step. Positive ions ablated directly from the solid were masked in ion mobility spectrometry/mass spectrometry (IMS/MS) studies by ionization of moisture and impurities. Positive ions from solids were seen only in the IMS analyzer at elevated temperature and low moisture. Under such conditions, materials were classified from mobility spectra alone with principal component analysis.


2019 ◽  
Vol 91 (12) ◽  
pp. 7554-7561 ◽  
Author(s):  
Charles Eldrid ◽  
Jakub Ujma ◽  
Symeon Kalfas ◽  
Nick Tomczyk ◽  
Kevin Giles ◽  
...  

2006 ◽  
Vol 78 (24) ◽  
pp. 8200-8206 ◽  
Author(s):  
Prabha Dwivedi ◽  
Ching Wu ◽  
Laura M. Matz ◽  
Brian H. Clowers ◽  
William F. Siems ◽  
...  

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