Development of an effective sample transfer device for biomarker detection in nasal secretions

2019 ◽  
Vol 585 ◽  
pp. 113404
Author(s):  
Young Ju Lee ◽  
Jae-Chul Lee ◽  
Young Gyu Eun ◽  
Gi-Ja Lee
Keyword(s):  
Biomarker Detection ◽  
Nasal Secretions ◽  
Sample Transfer ◽  
Transfer Device

Modifications Needed for Performing High-Resolution Cryosem in a Hitachi S-4700 Fesem Using an Emitech K1250 Cryo-Preparation System

2001 ◽  
Vol 7 (S2) ◽  
pp. 720-721
Author(s):  
Ya Chen ◽  
Chris Frethem ◽  
Stanley L. Erlandsen
Keyword(s):  
High Resolution ◽  
Thermal Contact ◽  
Control Unit ◽  
Thermal Capacity ◽  
Electron Beam Evaporation ◽  
Sample Holder ◽  
Sputter Coating ◽  
Magnetron Sputter ◽  
Sample Transfer ◽  
Transfer Device

Cryo-techniques have been successfully used in scanning electron microscopy (SEM). They are especially promising for high-resolution SEM to improve specimen preservation and reduce radiation damage [1, 2]. A number of cryo-preparation systems are commercially available for SEM, however, our experience has shown that modifications are needed to perform highresolution imaging (>50,000x).Emitech K1250 system consists of a sample preparation chamber, control unit, and cryo-stage. Magnetron sputter coating is standard and electron-beam evaporation is optional. A vacuum transfer device facilitates the sample transfer between the preparation chamber and the SEM to prevent contamination. The Emitech cryo-stage replaces the Hitachi S-4700 standard stage and the cryo-stage temperature is monitored and controlled by the Emitech control unit.The specimen is mounted on a sample holder that mounts to the cryo-stage. Therefore, the distance from the specimen to cryo-stage, the thermal capacity of the sample holder, and the thermal contact between them will affect the actual temperature of the specimen.

Ultrahigh‐vacuum sample transfer device with low‐temperature capability

1984 ◽  
Vol 55 (9) ◽  
pp. 1492-1494 ◽  
Author(s):  
N. J. DiNardo ◽  
J. E. Demuth ◽  
W. A. Thompson ◽  
P. G. Ledermann
Keyword(s):  
Low Temperature ◽  
Ultrahigh Vacuum ◽  
Temperature Capability ◽  
Sample Transfer ◽  
Transfer Device

scholarly journals Parallel DNA Template Preparation Using a Vacuum Filtration Sample Transfer Device

BioTechniques ◽  
2003 ◽  
Vol 34 (4) ◽  
pp. 862-868 ◽  
Author(s):  
J. Dunker ◽  
U. Larsson ◽  
D. Petersson ◽  
J. Forsell ◽  
A.-L. Schiller ◽  
...  
Keyword(s):  
Vacuum Filtration ◽  
Dna Template ◽  
Sample Transfer ◽  
Transfer Device

Ultrahigh vacuum sample transfer device with broad temperature range

1989 ◽  
Vol 60 (6) ◽  
pp. 1167-1168 ◽  
Author(s):  
H.‐J. Drouhin ◽  
M. Picard ◽  
D. Paget
Keyword(s):  
Ultrahigh Vacuum ◽  
Broad Temperature Range ◽  
Temperature Range ◽  
Sample Transfer ◽  
Transfer Device

High-Vacuum Evaporation and a Cryostage to Observe Fractured Yeast

1988 ◽  
Vol 46 ◽  
pp. 256-257
Author(s):  
William P. Wergin ◽  
Eric F. Erbe ◽  
Eugene L. Vigil
Keyword(s):  
Electron Microscope ◽  
Low Temperature ◽  
Standard Specimen ◽  
High Vacuum ◽  
Specimen Holder ◽  
Sputter Coating ◽  
Fresh Frozen ◽  
Gain Access ◽  
Scanning Electron ◽  
Transfer Device

Investigators have long realized the potential advantages of using a low temperature (LT) stage to examine fresh, frozen specimens in a scanning electron microscope (SEM). However, long working distances (W.D.), thick sputter coatings and surface contamination have prevented LTSEM from achieving results comparable to those from TEM freeze etch. To improve results, we recently modified techniques that involve a Hitachi S570 SEM, an Emscope SP2000 Sputter Cryo System and a Denton freeze etch unit. Because investigators have frequently utilized the fractured E face of the plasmalemma of yeast, this tissue was selected as a standard for comparison in the present study.In place of a standard specimen holder, a modified rivet was used to achieve a shorter W.D. (1 to -2 mm) and to gain access to the upper detector. However, the additional height afforded by the rivet, precluded use of the standard shroud on the Emscope specimen transfer device. Consequently, the sample became heavily contaminated (Fig. 1). A removable shroud was devised and used to reduce contamination (Fig. 2), but the specimen lacked clean fractured edges. This result suggested that low vacuum sputter coating was also limiting resolution.

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