Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
2014 ◽
Vol 49
(4)
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pp. 195-203
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2012 ◽
Vol 18
(S2)
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pp. 702-703
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2006 ◽
Vol 22
(11)
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pp. 1352-1358
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2015 ◽
Vol 21
(S3)
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pp. 1017-1018
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2016 ◽
Vol 84
◽
pp. 160-182
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