Quantitative stress measurements near blocked slip bands in austenitic stainless steel using high resolution electron backscatter diffraction

Stress Measurements ◽

Slip Bands ◽

Resolution Electron ◽

Electron Backscatter ◽

Quantitative Stress ◽

Surface polishing and slope cut by parallel ar ion beams for high resolution electron backscatter diffraction measurements

2014 International Conference on Nanoscience and Nanotechnology ◽

10.1109/iconn.2014.6965245 ◽

2014 ◽

Cited By ~ 2

Author(s):

Zs Radi ◽

K. Havancsak ◽

Sz Kalacska ◽

A. Baris

Keyword(s):

High Resolution ◽

Ion Beams ◽

Surface Polishing ◽

Resolution Electron ◽

Electron Backscatter ◽

Reliability of high-resolution electron backscatter diffraction determination of strain and rotation variations using phase-only and cross correlation

Crystal Research and Technology ◽

10.1002/crat.201300217 ◽

2014 ◽

Vol 49 (4) ◽

pp. 195-203 ◽

Cited By ~ 2

Author(s):

T. Riedl ◽

H. Wendrock

Keyword(s):

High Resolution ◽

Cross Correlation ◽

Diffraction Determination ◽

Resolution Electron ◽

Electron Backscatter ◽

Probing Deformation and Revealing Microstructural Mechanisms with Cross-Correlation-Based, High-Resolution Electron Backscatter Diffraction

JOM ◽

10.1007/s11837-013-0680-6 ◽

2013 ◽

Vol 65 (9) ◽

pp. 1245-1253 ◽

Cited By ~ 19

Author(s):

T. Ben Britton ◽

Jun Jiang ◽

Phani S. Karamched ◽

Angus J. Wilkinson

Keyword(s):

High Resolution ◽

Cross Correlation ◽

Resolution Electron ◽

Electron Backscatter ◽

Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

Microscopy and Microanalysis ◽

10.1017/s1431927612005363 ◽

2012 ◽

Vol 18 (S2) ◽

pp. 702-703 ◽

Cited By ~ 4

Author(s):

J.R. Seal ◽

T. Bieler ◽

M. Crimp ◽

B. Britton ◽

A. Wilkinson

Keyword(s):

High Resolution ◽

Pure Titanium ◽

Commercially Pure Titanium ◽

Contrast Imaging ◽

Commercially Pure ◽

Slip Transfer ◽

Resolution Electron ◽

Electron Backscatter ◽

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

On the effects of reorientation and shear transfer during twin formation: Comparison between high resolution electron backscatter diffraction experiments and a crystal plasticity finite element model

International Journal of Plasticity ◽

10.1016/j.ijplas.2016.05.006 ◽

2016 ◽

Vol 84 ◽

pp. 160-182 ◽

Cited By ~ 35

Author(s):

Hamidreza Abdolvand ◽

Angus J. Wilkinson

Keyword(s):

Finite Element ◽

High Resolution ◽

Element Model ◽

Shear Transfer ◽

Crystal Plasticity Finite Element ◽

Resolution Electron ◽

Electron Backscatter ◽

Twin Formation ◽

Crystal plasticity and high-resolution electron backscatter diffraction analysis of full-field polycrystal Ni superalloy strains and rotations under thermal loading

Acta Materialia ◽

10.1016/j.actamat.2014.07.036 ◽

2014 ◽

Vol 80 ◽

pp. 25-38 ◽

Cited By ~ 47

Author(s):

Tiantian Zhang ◽

David M. Collins ◽

Fionn P.E. Dunne ◽

Barbara A. Shollock

Keyword(s):

High Resolution ◽

Diffraction Analysis ◽

Crystal Plasticity ◽

Thermal Loading ◽

Full Field ◽

Resolution Electron ◽

Electron Backscatter ◽

Tensile deformation of 316L austenitic stainless steel using in-situ electron backscatter diffraction and crystal plasticity simulations

Materials Science and Engineering A ◽

10.1016/j.msea.2015.04.005 ◽

2015 ◽

Vol 637 ◽

pp. 48-55 ◽

Cited By ~ 27

Author(s):

Subhasis Sinha ◽

Jerzy A. Szpunar ◽

N.A.P. Kiran Kumar ◽

N.P. Gurao

Keyword(s):

Stainless Steel ◽

Austenitic Stainless Steel ◽

Crystal Plasticity ◽

Tensile Deformation ◽

Electron Backscatter ◽

316L Austenitic Stainless Steel ◽

High-resolution electron backscatter diffraction: An emerging tool for studying local deformation

The Journal of Strain Analysis for Engineering Design ◽

10.1243/03093247jsa587 ◽

2010 ◽

Vol 45 (5) ◽

pp. 365-376 ◽

Cited By ~ 60

Author(s):

A J Wilkinson ◽

E E Clarke ◽

T B Britton ◽

P Littlewood ◽

P S Karamched

Keyword(s):

High Resolution ◽

Local Deformation ◽

Resolution Electron ◽

Electron Backscatter ◽

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

Acta Materialia ◽

10.1016/j.actamat.2016.11.039 ◽

2017 ◽

Vol 125 ◽

pp. 125-135 ◽

Cited By ~ 28

Author(s):

A. Vilalta-Clemente ◽

G. Naresh-Kumar ◽

M. Nouf-Allehiani ◽

P. Gamarra ◽

M.A. di Forte-Poisson ◽

...

Keyword(s):

Thin Films ◽

High Resolution ◽

Cross Correlation ◽

Contrast Imaging ◽

Strain Mapping ◽

Electron Channelling ◽

Resolution Electron ◽

Electron Backscatter ◽

On the mechanistic basis of fatigue crack nucleation in Ni superalloy containing inclusions using high resolution electron backscatter diffraction

Acta Materialia ◽

10.1016/j.actamat.2015.06.035 ◽

2015 ◽

Vol 97 ◽

pp. 367-379 ◽

Cited By ~ 41

Author(s):

Jun Jiang ◽

Jie Yang ◽

Tiantian Zhang ◽

Fionn P.E. Dunne ◽

T. Ben Britton

Keyword(s):

Fatigue Crack ◽

High Resolution ◽

Crack Nucleation ◽

Fatigue Crack Nucleation ◽

Resolution Electron ◽

Electron Backscatter ◽

Mechanistic Basis ◽