Surface polishing and slope cut by parallel ar ion beams for high resolution electron backscatter diffraction measurements

2014 ◽  
Author(s):  
Zs Radi ◽  
K. Havancsak ◽  
Sz Kalacska ◽  
A. Baris
Keyword(s):  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Ion Beams ◽  
Surface Polishing ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

2012 ◽  
Vol 18 (S2) ◽  
pp. 702-703 ◽  
Author(s):  
J.R. Seal ◽  
T. Bieler ◽  
M. Crimp ◽  
B. Britton ◽  
A. Wilkinson
Keyword(s):  
High Resolution ◽  
Electron Backscatter Diffraction ◽  
Pure Titanium ◽  
Commercially Pure Titanium ◽  
Contrast Imaging ◽  
Commercially Pure ◽  
Slip Transfer ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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