Deep-learning-based anomaly detection for lace defect inspection employing videos in production line

2022 ◽  
Vol 51 ◽  
pp. 101471
Author(s):  
Bingyu Lu ◽  
Ding Xu ◽  
Biqing Huang
IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 59406-59419
Author(s):  
Milos Savic ◽  
Milan Lukic ◽  
Dragan Danilovic ◽  
Zarko Bodroski ◽  
Dragana Bajovic ◽  
...  

Author(s):  
Ruoying Wang ◽  
Kexin Nie ◽  
Tie Wang ◽  
Yang Yang ◽  
Bo Long

Sensors ◽  
2021 ◽  
Vol 21 (13) ◽  
pp. 4292
Author(s):  
Horng-Horng Lin ◽  
Harshad Kumar Dandage ◽  
Keh-Moh Lin ◽  
You-Teh Lin ◽  
Yeou-Jiunn Chen

Solar cells may possess defects during the manufacturing process in photovoltaic (PV) industries. To precisely evaluate the effectiveness of solar PV modules, manufacturing defects are required to be identified. Conventional defect inspection in industries mainly depends on manual defect inspection by highly skilled inspectors, which may still give inconsistent, subjective identification results. In order to automatize the visual defect inspection process, an automatic cell segmentation technique and a convolutional neural network (CNN)-based defect detection system with pseudo-colorization of defects is designed in this paper. High-resolution Electroluminescence (EL) images of single-crystalline silicon (sc-Si) solar PV modules are used in our study for the detection of defects and their quality inspection. Firstly, an automatic cell segmentation methodology is developed to extract cells from an EL image. Secondly, defect detection can be actualized by CNN-based defect detector and can be visualized with pseudo-colors. We used contour tracing to accurately localize the panel region and a probabilistic Hough transform to identify gridlines and busbars on the extracted panel region for cell segmentation. A cell-based defect identification system was developed using state-of-the-art deep learning in CNNs. The detected defects are imposed with pseudo-colors for enhancing defect visualization using K-means clustering. Our automatic cell segmentation methodology can segment cells from an EL image in about 2.71 s. The average segmentation errors along the x-direction and y-direction are only 1.6 pixels and 1.4 pixels, respectively. The defect detection approach on segmented cells achieves 99.8% accuracy. Along with defect detection, the defect regions on a cell are furnished with pseudo-colors to enhance the visualization.


2021 ◽  
Vol 11 (15) ◽  
pp. 7050
Author(s):  
Zeeshan Ahmad ◽  
Adnan Shahid Khan ◽  
Kashif Nisar ◽  
Iram Haider ◽  
Rosilah Hassan ◽  
...  

The revolutionary idea of the internet of things (IoT) architecture has gained enormous popularity over the last decade, resulting in an exponential growth in the IoT networks, connected devices, and the data processed therein. Since IoT devices generate and exchange sensitive data over the traditional internet, security has become a prime concern due to the generation of zero-day cyberattacks. A network-based intrusion detection system (NIDS) can provide the much-needed efficient security solution to the IoT network by protecting the network entry points through constant network traffic monitoring. Recent NIDS have a high false alarm rate (FAR) in detecting the anomalies, including the novel and zero-day anomalies. This paper proposes an efficient anomaly detection mechanism using mutual information (MI), considering a deep neural network (DNN) for an IoT network. A comparative analysis of different deep-learning models such as DNN, Convolutional Neural Network, Recurrent Neural Network, and its different variants, such as Gated Recurrent Unit and Long Short-term Memory is performed considering the IoT-Botnet 2020 dataset. Experimental results show the improvement of 0.57–2.6% in terms of the model’s accuracy, while at the same time reducing the FAR by 0.23–7.98% to show the effectiveness of the DNN-based NIDS model compared to the well-known deep learning models. It was also observed that using only the 16–35 best numerical features selected using MI instead of 80 features of the dataset result in almost negligible degradation in the model’s performance but helped in decreasing the overall model’s complexity. In addition, the overall accuracy of the DL-based models is further improved by almost 0.99–3.45% in terms of the detection accuracy considering only the top five categorical and numerical features.


IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 120043-120065
Author(s):  
Kukjin Choi ◽  
Jihun Yi ◽  
Changhwa Park ◽  
Sungroh Yoon

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