Comparison of neutron and high-energy X-ray dual-beam radiography for air cargo inspection

2008 ◽  
Vol 66 (4) ◽  
pp. 463-473 ◽  
Author(s):  
Y. Liu ◽  
B.D. Sowerby ◽  
J.R. Tickner
2002 ◽  
Author(s):  
William W. Sapp, Jr. ◽  
Lee Grodzins ◽  
Peter J. Rothschild ◽  
Richard L. Schueller

2015 ◽  
Vol 1085 ◽  
pp. 455-459 ◽  
Author(s):  
Sergei P. Osipov ◽  
Vasilii A. Klimenov ◽  
Oleg S. Osipov ◽  
Vil'dan D. Samigullin ◽  
Aleksandr M. Shtein

The paper presents foundations of the algorithm of processing primary radiographic images of large-size cargoes that allows determination of their masses. Two possible approaches to form definite algorithm of processing radiographic information were analyzed. The choice of the approaches depends on the completeness of information about the test object. The first approach to design mass determination algorithm is connected with inspecting industrial products. Industrial inspecting products are characterized by a completeness of information about the material, its structure, the geometry. The information augmented by selecting maximum X-ray energy and calibrating by test object allows determination the mass of inspecting object by the only radiographic image with high precision. The second approach is caused by indeterminacy and incomplete information about inspecting object. This case is typical for problems of cargo inspection. Corresponding algorithm modification is based on using dual-energy X-ray imaging that allows determination of the effective atomic number of test object and provision of the required precision of mass estimation.


2011 ◽  
Vol 1 (0) ◽  
pp. 285-287 ◽  
Author(s):  
Yuri NAKAGAWA ◽  
Jun KAWARABAYASHI ◽  
Ken-ichi WATANABE ◽  
Hideki TOMITA ◽  
Hiroyuki TOYOKAWA ◽  
...  

2012 ◽  
Vol 61 (5) ◽  
pp. 821-824 ◽  
Author(s):  
Jiseoc Lee ◽  
Yunjeong Lee ◽  
Seungryong Cho ◽  
Byung-Cheol Lee

2017 ◽  
Vol 77 (8) ◽  
pp. 9379-9391 ◽  
Author(s):  
Selina Kolokytha ◽  
Alexander Flisch ◽  
Thomas Lüthi ◽  
Mathieu Plamondon ◽  
Wicher Visser ◽  
...  

2020 ◽  
Vol 77 (12) ◽  
pp. 1260-1264
Author(s):  
Hyojeong Choi ◽  
Jeong Min Park ◽  
Chang Goo Kang ◽  
Su Jin Kim ◽  
Byeong Hyeok Kim ◽  
...  

Author(s):  
E. B. Steel

High Purity Germanium (HPGe) x-ray detectors are now commercially available for the analytical electron microscope (AEM). The detectors have superior efficiency at high x-ray energies and superior resolution compared to traditional lithium-drifted silicon [Si(Li)] detectors. However, just as for the Si(Li), the use of the HPGe detectors requires the determination of sensitivity factors for the quantitative chemical analysis of specimens in the AEM. Detector performance, including incomplete charge, resolution, and durability has been compared to a first generation detector. Sensitivity factors for many elements with atomic numbers 10 through 92 have been determined at 100, 200, and 300 keV. This data is compared to Si(Li) detector sensitivity factors.The overall sensitivity and utility of high energy K-lines are reviewed and discussed. Many instruments have one or more high energy K-line backgrounds that will affect specific analytes. One detector-instrument-specimen holder combination had a consistent Pb K-line background while another had a W K-line background.


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