Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films
2013 ◽
Vol 265
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pp. 358-362
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2005 ◽
Vol 109
(51)
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pp. 11724-11732
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2007 ◽
Vol 156-158
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pp. 303-306
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Electronic Structure and X-ray Absorption Spectra of Rutile TiO2 Using First-Principles Calculations
2014 ◽
Vol 52
(12)
◽
pp. 1025-1029
Keyword(s):
X Ray
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