Fine Structures of the X-Ray Absorption Spectra for Thin Films of Metallic Coppers

1970 ◽  
Vol 9 (11) ◽  
pp. 1372-1377
Author(s):  
Hayao Kubo ◽  
Hiroo Nakamori ◽  
Kenjiro Tsutsumi
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
X Ray ◽  
Fine Structures ◽  
X Ray Absorption

Origin of fine structures on the dissociative 1s→σ∗ resonance in X-ray absorption spectra of O2

2009 ◽  
Vol 476 (4-6) ◽  
pp. 147-150 ◽  
Author(s):  
Yasen Velkov ◽  
Victor Kimberg ◽  
Nobuhiro Kosugi ◽  
Paweł Sałek ◽  
Faris Gel’mukhanov
Keyword(s):  
Absorption Spectra ◽  
X Ray ◽  
Fine Structures ◽  
X Ray Absorption

Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films

2013 ◽  
Vol 265 ◽  
pp. 358-362 ◽  
Author(s):  
W. Cao ◽  
M. Masnadi ◽  
S. Eger ◽  
M. Martinson ◽  
Q.-F. Xiao ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Linear Dichroism ◽  
X Ray ◽  
X Ray Absorption

X-Ray Absorption Fine Structure (Xafs) Studies Of Cobalt Silicide Thin Films

1998 ◽  
Vol 524 ◽  
Author(s):  
S. J. Naftel ◽  
I Coulthard ◽  
Y. Hu ◽  
T. K. Sham ◽  
M. Zinke-Allmang
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Fluorescence Yield ◽  
Sputter Deposition ◽  
Cobalt Silicide ◽  
Total Electron ◽  
X Ray ◽  
Absorption Fine ◽  
Fine Structures ◽  
X Ray Absorption

ABSTRACTCobalt silicide thin films, prepared on Si(100) wafers, have been studied by X-ray absorption near edge structures (XANES) at the Si K-, L2,3 and Co K-edges utilizing both total electron (TEY) and fluorescence yield (FLY) detection as well as extended X-ray absorption fine structure (EXAFS) at the Co K-edge. Samples made using DC sputter deposition on clean Si surfaces and MBE were studied along with a bulk CoSi2 sample. XANES and EXAFS provide information about the electronic structure and morphology of the films. It was found that the films studied have essentially the same structure as bulk CoSi2. Both the spectroscopy and materials characterization aspects of XAFS (X-ray absorption fine structures) are discussed.

Ti K-edge X-ray absorption spectra of spray pyrolysis synthesized TiO2-x and TiO2-x Nx thin films

2017 ◽  
Author(s):  
Madhusmita Sahoo ◽  
Ashok Kumar Yadav ◽  
S. N. Jha ◽  
Dibyendu Bhattacharyya ◽  
Tom Mathews ◽  
...  
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Absorption Spectra ◽  
X Ray ◽  
X Ray Absorption

A comparison of fine structures in high-resolution x-ray-absorption spectra of various condensed organic molecules

2005 ◽  
Vol 123 (4) ◽  
pp. 044509 ◽  
Author(s):  
A. Schoell ◽  
Y. Zou ◽  
D. Huebner ◽  
S. G. Urquhart ◽  
Th. Schmidt ◽  
...  
Keyword(s):  
High Resolution ◽  
Absorption Spectra ◽  
Organic Molecules ◽  
X Ray ◽  
Fine Structures ◽  
X Ray Absorption

Effect of phase composition on X-ray absorption spectra of ZrO2 thin films

2007 ◽  
Vol 156-158 ◽  
pp. 303-306 ◽  
Author(s):  
A. Kikas ◽  
J. Aarik ◽  
V. Kisand ◽  
K. Kooser ◽  
T. Käämbre ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Composition ◽  
Absorption Spectra ◽  
X Ray ◽  
X Ray Absorption
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