Analyzing optical properties of thin vanadium oxide films through semiconductor-to-metal phase transition using spectroscopic ellipsometry
2017 ◽
Vol 421
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pp. 819-823
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2015 ◽
Vol 19
(sup9)
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pp. S9-369-S9-371
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2014 ◽
Vol 67
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pp. 126-130
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1986 ◽
Vol 4
(3)
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pp. 432-435
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2016 ◽
Vol 96
(11)
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pp. 440-446
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2015 ◽
Vol 50
(17)
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pp. 5709-5714
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