MWCNTs based high sensitive lateral flow strip biosensor for rapid determination of aqueous mercury ions

The analytical performances of a lateral flow immunoassay (AFLA-V AQUA™, Vicam a Waters Business) for the determination of aflatoxins in maize were evaluated according to Commission Regulation (EU) No. 519/2014.

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Visual and fluorometric lateral flow immunoassay combined with a dual-functional test mode for rapid determination of tetracycline antibiotics

Microchimica Acta ◽

10.1007/s00604-018-2945-9 ◽

2018 ◽

Vol 185 (9) ◽

Cited By ~ 26

Author(s):

Wei Sheng ◽

Qing Chang ◽

Yingjie Shi ◽

Wenxia Duan ◽

Yan Zhang ◽

...

Keyword(s):

Rapid Determination ◽

Lateral Flow ◽

Functional Test ◽

Lateral Flow Immunoassay ◽

Tetracycline Antibiotics ◽

Test Mode ◽

Dual Functional

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Lateral flow immunostrips for the sensitive and rapid determination of 8-hydroxy-2′-deoxyguanosine using upconversion nanoparticles

Microchimica Acta ◽

10.1007/s00604-020-04349-w ◽

2020 ◽

Vol 187 (7) ◽

Author(s):

Nengying Wu ◽

Yuxi Wei ◽

Lanlan Pan ◽

Xiaolin Yang ◽

Honglan Qi ◽

...

Keyword(s):

Rapid Determination ◽

Lateral Flow ◽

Upconversion Nanoparticles

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Study for Rapid Determination of Tetrodotoxin Based on Lateral Flow Immunoassay

Proceedings of the 2nd Annual International Conference on Advanced Material Engineering (AME 2016) ◽

10.2991/ame-16.2016.212 ◽

2016 ◽

Author(s):

Jun Chen ◽

Jing Zhao ◽

Ning-Ping Tao ◽

Jian Cong

Keyword(s):

Rapid Determination ◽

Lateral Flow ◽

Lateral Flow Immunoassay

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Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092918 ◽

1976 ◽

Vol 34 ◽

pp. 590-591

Author(s):

T. Y. Tan ◽

W. K. Tice

Keyword(s):

Fast Neutron ◽

Rapid Determination ◽

Stacking Faults ◽

Imaging Method ◽

Large Reduction ◽

Dislocation Loops ◽

Fringe Spacing ◽

Weak Beam ◽

Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

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