Rapid determination of monopersulfate with bromide ion-catalyzed oxidation of 2, 2′-azino-bis(3-ethylbenzothiazoline-6-sulfonic acid (ABTS)

Abstract A method is presented for rapid determination of bromide ion in commodities and blood by paired-ion liquid chromatography with electrochemical detection. The method involves extraction of samples with water and filtration. Blood is passed through a Sep-Pak C18 minicolumn. Recoveries are usually close to 100%, with satisfactory precision. The detection limit is 1 mg/kg. The method needs little labor and uses no noxious solvents or reagents.

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Rapid determination of lipids containing free amino groups with trinitrobenzene sulfonic acid reagent

Lipids ◽

10.1007/bf02532009 ◽

1967 ◽

Vol 2 (1) ◽

pp. 87-88 ◽

Cited By ~ 21

Author(s):

A. N. Siakotos

Keyword(s):

Free Amino ◽

Sulfonic Acid ◽

Rapid Determination ◽

Trinitrobenzene Sulfonic Acid ◽

Amino Groups ◽

Acid Reagent

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The determination of Cu, Ni, and Co using 2-(2-pyridylazo)-1-naphtol-4-sulfonic acid by multicomponent flow injection analysis (MC-FIA)

Collection of Czechoslovak Chemical Communications ◽

10.1135/cccc19881162 ◽

1988 ◽

Vol 53 (6) ◽

pp. 1162-1171 ◽

Cited By ~ 3

Author(s):

Petr Doležel ◽

Vlastimil Kubáň

Keyword(s):

Flow Injection ◽

Flow Injection Analysis ◽

Sulfonic Acid ◽

Rapid Determination ◽

Reverse Flow ◽

Analytical Signal ◽

Ternary Mixtures ◽

The Individual ◽

Reverse Flow Injection Analysis

2-(2-Pyridylazo)-1-naphthol-4-sulfonic acid (1PAN4S) was used to develop a method for the simultaneous spectrophotometric determination of Cu(II), Ni(II), and Co(III) by reverse flow injection analysis (FIA) using a multichannel UV-VIS detector with a diode array. The method can be used to determine the individual ions in the range 5-50 μmol dm-3 Ni(II) or Cu(II) and 5-60 μmol dm-3 Co(III) in binary and ternary mixtures at ratios of 1 : 1 to 1 : 10 with a maximal relative deviation of units of per cent for the major components and tens of per cent for the minor components. The precision and accuracy of the determination are the same or slightly worse than for stationary measurements with half to one fifth the sensitivity. Measurement of the absorption spectra for the maximum analytical signal in digital form for c(1PAN4S) = 0·12 mmol dm-3, c(NaIO4) = 1·2 mmol dm-3 in 0·2M acetate buffer medium at pH 5·00 permits rapid determination (15 s per sample) of all the components using a simple program for multicomponent analysis in "overdetermined" systems.

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Weak Beam Imaging and Diffraction Studies of Stacking Faults in Silicon

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092918 ◽

1976 ◽

Vol 34 ◽

pp. 590-591

Author(s):

T. Y. Tan ◽

W. K. Tice

Keyword(s):

Fast Neutron ◽

Rapid Determination ◽

Stacking Faults ◽

Imaging Method ◽

Large Reduction ◽

Dislocation Loops ◽

Fringe Spacing ◽

Weak Beam ◽

Kinematical Theory

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.

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