Piezoresponse force microscopy characterization of rare-earth doped BiFeO3 thin films grown by the soft chemical method

AbstractThe piezoelectric properties of PTO thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

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Piezoresponse force microscopy characterization of high aspect ratio ferroelectric nanostructures

Journal of Applied Physics ◽

10.1063/1.4746075 ◽

2012 ◽

Vol 112 (5) ◽

pp. 052012 ◽

Cited By ~ 3

Author(s):

Ashley Bernal ◽

Nazanin Bassiri-Gharb

Keyword(s):

Aspect Ratio ◽

High Aspect Ratio ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Microscopy Characterization

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Characterization of Nanomechanical, Ferroelectric, and Piezoelectric Properties by Nanoindentation and Piezoresponse Force Microscopy of PbTiO3 Thin Films

Industrial & Engineering Chemistry Research ◽

10.1021/ie401134m ◽

2013 ◽

Vol 52 (40) ◽

pp. 14328-14334 ◽

Cited By ~ 3

Author(s):

Juan Ramos-Cano ◽

Mario Miki-Yoshida ◽

André Marino Gonçalves ◽

José Antônio Eiras ◽

Jesús González-Hernández ◽

...

Keyword(s):

Thin Films ◽

Piezoelectric Properties ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Ferroelectric And Piezoelectric Properties

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Three-dimensional ferroelectric domain imaging of epitaxial BiFeO3 thin films using angle-resolved piezoresponse force microscopy

Applied Physics Letters ◽

10.1063/1.3487933 ◽

2010 ◽

Vol 97 (11) ◽

pp. 112907 ◽

Cited By ~ 44

Author(s):

Moonkyu Park ◽

Seungbum Hong ◽

Jeffrey A. Klug ◽

Michael J. Bedzyk ◽

Orlando Auciello ◽

...

Keyword(s):

Thin Films ◽

Three Dimensional ◽

Piezoresponse Force Microscopy ◽

Ferroelectric Domain ◽

Force Microscopy ◽

Bifeo3 Thin Films

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Piezoresponse Force Microscopy Studies of pc-BiFeO3 Thin Films Produced by the Simultaneous Laser Ablation of Bi and FeO3

MRS Proceedings ◽

10.1557/opl.2012.1724 ◽

2012 ◽

Vol 1477 ◽

Author(s):

C. I. Enriquez-Flores ◽

J. J. Gervacio-Arciniega ◽

F. J. Flores-Ruiz ◽

D. Cardona ◽

E. Camps ◽

...

Keyword(s):

Thin Films ◽

Pulsed Laser ◽

Domain Size ◽

Piezoresponse Force Microscopy ◽

Laser Deposition ◽

Bismuth Iron Oxide ◽

Deposition Technique ◽

Force Microscopy ◽

Bifeo3 Thin Films ◽

Ferroelectric Domains

ABSTRACTBismuth iron oxide BFO films were produced by the pulsed laser deposition technique. These films are a mixture of BiFeO3 ferroelectrical and Bi25FeO40 piezoelectrical phases. The ferroelectrical domain structure of these films was studied via contact resonance piezoresponse force microscopy (CR-PFM) and resonance tracking PFM (RT-PFM). The proportions of area of these BFO phases were derived from the PFM images. The ferroelectrical domain size corresponds to the size of the BiFeO3 crystals. The CR-PFM and RT-PFM techniques allowed us to be able to distinguish between the ferroelectric domains and the piezoelectric regions existing in the polycrystalline films.

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