Equipment performance analysis of a Canadian Kraft mill. Part II: Diagnostics and identification of improvement projects

2016 ◽  
Vol 115 ◽  
pp. 107-115 ◽  
Author(s):  
Radia Ammara ◽  
Louis Fradette ◽  
Jean Paris
Keyword(s):  
Performance Analysis ◽  
Kraft Mill ◽  
Equipment Performance

Study and Simulation of the Model of Stability Measurement for Integrated Semiconductor Equipment

2013 ◽  
Vol 756-759 ◽  
pp. 380-383
Author(s):  
Fang Xue ◽  
Hai Fei Wang
Keyword(s):  
Performance Analysis ◽  
Performance Measurement ◽  
System Design ◽  
Measurement Model ◽  
Throughput Model ◽  
Stability Measurement ◽  
The Stability ◽  
The Relationship ◽  
Capacity Prediction ◽  
Equipment Performance

Performance analysis and capacity prediction of integrated semiconductor equipment is a very difficult task, it is a effective way to solve this problem by setting up a model of equipment performance measurement. This paper details the composition and related operation principle of parallel integrated semiconductor equipment. This paper also deriving a set of stability measurement model, we call it Throughput Model, for integrated semiconductor equipment according to its operation principle, which reflect the relationship between stability and output error. The model can effectively calculate the stability of equipment and help system design.

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