scholarly journals Water drop-surface interactions as the basis for the design of anti-fogging surfaces: Theory, practice, and applications trends

2019 ◽  
Vol 263 ◽  
pp. 68-94 ◽  
Author(s):  
Iván Rodríguez Durán ◽  
Gaétan Laroche
2021 ◽  
Vol 2 (1) ◽  
Author(s):  
Zhuoyun Cai ◽  
Artem Skabeev ◽  
Svetlana Morozova ◽  
Jonathan T. Pham

AbstractWhen a water drop is placed onto a soft polymer network, a wetting ridge develops at the drop periphery. The height of this wetting ridge is typically governed by the drop surface tension balanced by elastic restoring forces of the polymer network. However, the situation is more complex when the network is swollen with fluid, because the fluid may separate from the network at the contact line. Here we study the fluid separation and network deformation at the contact line of a soft polydimethylsiloxane (PDMS) network, swollen with silicone oil. By controlling both the degrees of crosslinking and swelling, we find that more fluid separates from the network with increasing swelling. Above a certain swelling, network deformation decreases while fluid separation increases, demonstrating synergy between network deformation and fluid separation. When the PDMS network is swollen with a fluid having a negative spreading parameter, such as hexadecane, no fluid separation is observed. A simple balance of interfacial, elastic, and mixing energies can describe this fluid separation behavior. Our results reveal that a swelling fluid, commonly found in soft networks, plays a critical role in a wetting ridge.


2018 ◽  
Vol 51 ◽  
pp. 190-197 ◽  
Author(s):  
Quanli Zhang ◽  
Qingliang Zhao ◽  
Suet To ◽  
Bing Guo ◽  
Zhimin Rao

1971 ◽  
Vol 76 (21) ◽  
pp. 5112-5116 ◽  
Author(s):  
G. L. Siscoe ◽  
Zev Levin

Author(s):  
W. Lo ◽  
J.C.H. Spence ◽  
M. Kuwabara

Work on the integration of STM with REM has demonstrated the usefulness of this combination. The STM has been designed to replace the side entry holder of a commercial Philips 400T TEM. It allows simultaneous REM imaging of the tip/sample region of the STM (see fig. 1). The REM technique offers nigh sensitivity to strain (<10−4) through diffraction contrast and high resolution (<lnm) along the unforeshortened direction. It is an ideal technique to use for studying tip/surface interactions in STM.The elastic strain associated with tunnelling was first imaged on cleaved, highly doped (S doped, 5 × 1018cm-3) InP(110). The tip and surface damage observed provided strong evidence that the strain was caused by tip/surface contact, most likely through an insulating adsorbate layer. This is consistent with the picture that tunnelling in air, liquid or ordinary vacuum (such as in a TEM) occurs through a layer of contamination. The tip, under servo control, must compress the insulating contamination layer in order to get close enough to the sample to tunnel. The contaminant thereby transmits the stress to the sample. Elastic strain while tunnelling from graphite has been detected by others, but never directly imaged before. Recent results using the STM/REM combination has yielded the first direct evidence of strain while tunnelling from graphite. Figure 2 shows a graphite surface elastically strained by the STM tip while tunnelling (It=3nA, Vtip=−20mV). Video images of other graphite surfaces show a reversible strain feature following the tip as it is scanned. The elastic strain field is sometimes seen to extend hundreds of nanometers from the tip. Also commonly observed while tunnelling from graphite is an increase in the RHEED intensity of the scanned region (see fig.3). Debris is seen on the tip and along the left edges of the brightened scan region of figure 4, suggesting that tip abrasion of the surface has occurred. High resolution TEM images of other tips show what appear to be attached graphite flakes. The removal of contamination, possibly along with the top few layers of graphite, seems a likely explanation for the observed increase in RHEED reflectivity. These results are not inconsistent with the “sliding planes” model of tunnelling on graphite“. Here, it was proposed that the force due to the tunnelling probe acts over a large area, causing shear of the graphite planes when the tip is scanned. The tunneling current is then modulated as the planes of graphite slide in and out of registry. The possiblity of true vacuum tunnelling from the cleaned graphite surface has not been ruled out. STM work function measurements are needed to test this.


Equipment ◽  
2006 ◽  
Author(s):  
Mohammed El Ganaoui ◽  
M. Benyettou ◽  
H. Alla

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