A novel two-fold state skip logic Built-In Self-Test scheme for digital circuits
2015 ◽
Vol 48
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pp. 239-246
Keyword(s):
2004 ◽
Vol 20
(6)
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pp. 623-638
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2008 ◽
Vol E91-C
(10)
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pp. 1713-1716
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2008 ◽
Vol 55
(6)
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pp. 3130-3135
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