Reflection analysis for Stoneley waves encountering interfacial delamination

2020 ◽  
Vol 253 ◽  
pp. 112771
Author(s):  
Ming-hang Li ◽  
Bing Li ◽  
Zhi-yuan Zhang ◽  
Guang-yuan Gao

2021 ◽  
Vol 43 ◽  
pp. 101199
Author(s):  
Jacob Brenneman ◽  
Derya Z. Tansel ◽  
Gary K. Fedder ◽  
Rahul Panat


2021 ◽  
Vol 1128 (1) ◽  
pp. 012018
Author(s):  
M Sai Krishnan ◽  
S Jeyanthi ◽  
Pradeep Kumar Mani ◽  
K T Hareesh ◽  
M. C Lenin Babu


1996 ◽  
Vol 445 ◽  
Author(s):  
Nickolaos Strifas ◽  
Aris Christou

AbstractThe reliability of plastic packaged integrated circuits was assessed from the point of view of interfacial mechanical integrity. It is shown that the effect of structural weaknesses caused by poor bonding, voids, microcracks or delamination may not be evident in the electrical performance characteristics, but may cause premature failure. Acoustic microscopy (C-SAM) was selected for nondestructive failure analysis of the plastic integrated circuit (IC) packages. Integrated circuits in plastic dual in line packages were initially subjected to temperature (25 °C to 85 °C) and humidity cycling (50 to 85 %) where each cycle was of one hour duration and for over 100 cycles and then analyzed. Delamination at the interfaces between the different materials within the package, which is a major cause of moisture ingress and subsequent premature package failure, was measured. The principal areas of delamination were found along the leads extending from the chip to the edge of the molded body and along the die surface itself. Images of the 3-D internal structure were produced that were used to determine the mechanism for a package failure. The evidence of corrosion and stress corrosion cracks in the regions of delamination was identified.



2016 ◽  
Vol 7 (9) ◽  
pp. 1602111 ◽  
Author(s):  
Arman Mahboubi Soufiani ◽  
Ziv Hameiri ◽  
Steffen Meyer ◽  
Sean Lim ◽  
Murad Jehangir Yusuf Tayebjee ◽  
...  


1984 ◽  
Vol 32 (3) ◽  
pp. 349-356 ◽  
Author(s):  
A.R. Thölén


1998 ◽  
Author(s):  
A. Brie ◽  
T. Endo ◽  
D.L. Johnson ◽  
F. Pampuri




2007 ◽  
Vol 336-338 ◽  
pp. 2513-2516
Author(s):  
Hua Jian Chang ◽  
Shu Wen Zhan

A micromechanical approach is developed to investigate the behavior of composite materials, which undergo interfacial delamination. The main objective of this approach is to build a bridge between the intricate theories and the engineering applications. On the basis of the spring-layer model, which is useful to treat the interfacial debonding and sliding, the present paper proposes a convenient method to assess the effects of delamination on the overall properties of composites. By applying the Equivalent Inclusion Method (EIM), two fundamental tensors are derived in the present model, the modified Eshelby tensor, and the compliance tensor (or stiffness tensor) of the weakened inclusions. Both of them are the fundamental tensors for constructing the overall constitutive law of composite materials. By simply substituting these tensors into an existing constitutive model, for instance, the Mori-Tanaka model, one can easily evaluate the effects of interfacial delamination on the overall properties of composite materials. Therefore, the present method offers a pretty convenient tool. Some numerical results are carried out in order to demonstrate the performance of this model.



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