Electrical and optical characterization of electron-irradiated 4H-SiC epitaxial layers annealed at low temperature
2005 ◽
Vol 14
(3-7)
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pp. 1150-1153
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1996 ◽
Vol 14
(3)
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pp. 2275
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2017 ◽
Vol 10
(15)
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pp. 1-5
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1990 ◽
Vol 56
(7)
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pp. 1202-1205
1998 ◽
Vol 34
(8)
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pp. 1426-1437
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