Unraveling nanoscale conduction and work function in a poly(3,4-ethylenedioxypyrrole)/carbon nanotube composite by Kelvin probe force microscopy and conducting atomic force microscopy

Electrochimica Acta ◽

10.1016/j.electacta.2012.03.051 ◽

2012 ◽

Vol 70 ◽

pp. 228-240 ◽

Author(s):

B. Narsimha Reddy ◽

Melepurath Deepa

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Work Function ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Carbon Nanotube Composite

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Atomic Force Microscopy and Kelvin Probe Force Microscopy Measurements of Semiconductor Surface Using Carbon Nanotube Tip Fabricated by Electrophoresis

Japanese Journal of Applied Physics ◽

10.1143/jjap.41.2615 ◽

2002 ◽

Vol 41 (Part 1, No. 4B) ◽

pp. 2615-2619 ◽

Author(s):

Chikashi Maeda ◽

Norihito Ozeki ◽

Shigeru Kishimoto ◽

Takashi Mizutani ◽

Toshiki Sugai ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Carbon Nanotube ◽

Kelvin Probe Force Microscopy ◽

Semiconductor Surface ◽

Kelvin Probe ◽

Force Microscopy ◽

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Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

ACS Nano ◽

10.1021/acsnano.7b08997 ◽

2018 ◽

Vol 12 (6) ◽

pp. 5274-5283 ◽

Author(s):

Fabian Schulz ◽

Juha Ritala ◽

Ondrej Krejčí ◽

Ari Paavo Seitsonen ◽

Adam S. Foster ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

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Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

Ultramicroscopy ◽

10.1016/s0304-3991(02)00091-8 ◽

2002 ◽

Vol 91 (1-4) ◽

pp. 127-132 ◽

Author(s):

Shiano Ono ◽

Misaichi Takeuchi ◽

Takuji Takahashi

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Inas Nanowires ◽

Mode Atomic Force Microscopy

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Investigating atomic contrast in atomic force microscopy and Kelvin probe force microscopy on ionic systems using functionalized tips

Physical Review B ◽

10.1103/physrevb.90.155455 ◽

2014 ◽

Vol 90 (15) ◽

Author(s):

Leo Gross ◽

Bruno Schuler ◽

Fabian Mohn ◽

Nikolaj Moll ◽

Niko Pavliček ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Ionic Systems ◽

Functionalized Tips

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Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3367983 ◽

2010 ◽

Vol 28 (3) ◽

pp. C4D24-C4D28 ◽

Author(s):

Eika Tsunemi ◽

Kei Kobayashi ◽

Kazumi Matsushige ◽

Hirofumi Yamada

Keyword(s):

Atomic Force Microscopy ◽

Frequency Modulation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Probe Frequency ◽

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Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

Japanese Journal of Applied Physics ◽

10.7567/jjap.56.08lb05 ◽

2017 ◽

Vol 56 (8S1) ◽

pp. 08LB05 ◽

Author(s):

Takeshi Uruma ◽

Nobuo Satoh ◽

Hidekazu Yamamoto

Keyword(s):

Silicon Carbide ◽

Atomic Force Microscopy ◽

Schottky Barrier ◽

Reverse Bias ◽

Schottky Barrier Diode ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

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The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

AIP Advances ◽

10.1063/1.4818119 ◽

2013 ◽

Vol 3 (8) ◽

pp. 082107 ◽

Author(s):

Yuanmin Du ◽

Amit Kumar ◽

Hui Pan ◽

Kaiyang Zeng ◽

Shijie Wang ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Resistive Switching ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Atomic Force Microscopy and Kelvin Probe Force Microscopy Evidence of Local Structural Inhomogeneity and Nonuniform Dopant Distribution in Conducting Polybithiophene

The Journal of Physical Chemistry ◽

10.1021/jp960844y ◽

1996 ◽

Vol 100 (48) ◽

pp. 18603-18606 ◽

Author(s):

Oleg A. Semenikhin ◽

Lei Jiang ◽

Tomokazu Iyoda ◽

Kazuhito Hashimoto ◽

Akira Fujishima

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Structural Inhomogeneity ◽

Dopant Distribution ◽

Kelvin Probe ◽

Force Microscopy ◽

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Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy

Nano Research ◽

10.1007/s12274-021-3809-x ◽

2021 ◽

Author(s):

Yuuki Adachi ◽

Yasuhiro Sugawara ◽

Yan Jun Li

Keyword(s):

Atomic Force Microscopy ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Rutile Tio2 ◽

Force Microscopy ◽

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On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

Microscopy and Microanalysis ◽

10.1017/s1431927618000156 ◽

2018 ◽

Vol 24 (2) ◽

pp. 126-131 ◽

Author(s):

Sergey Y. Luchkin ◽

Keith J. Stevenson

Keyword(s):

Atomic Force Microscopy ◽

Spatial Resolution ◽

Electrostatic Force ◽

Experimental Results ◽

Kelvin Probe Force Microscopy ◽

Atomic Force Microscopy Probe ◽

Kelvin Probe ◽

Force Microscopy ◽

Atomic Force ◽

Potential Sensitivity

AbstractIn this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

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