Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

2002 ◽  
Vol 91 (1-4) ◽  
pp. 127-132 ◽  
Author(s):  
Shiano Ono ◽  
Misaichi Takeuchi ◽  
Takuji Takahashi
Keyword(s):  
Atomic Force Microscopy ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Inas Nanowires ◽  
Mode Atomic Force Microscopy

scholarly journals Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

ACS Nano ◽  
2018 ◽  
Vol 12 (6) ◽  
pp. 5274-5283 ◽  
Author(s):  
Fabian Schulz ◽  
Juha Ritala ◽  
Ondrej Krejčí ◽  
Ari Paavo Seitsonen ◽  
Adam S. Foster ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force

Vibrational Response of FeNi3Nanoparticles to the Flux of a Modulated Electromagnetic Field Detected by Contact-Mode Atomic Force Microscopy

2013 ◽  
Vol 117 (36) ◽  
pp. 18768-18776 ◽  
Author(s):  
Algernon T. Kelley ◽  
Wilson K. Serem ◽  
Stephanie L. Daniels ◽  
Lauren E. Englade-Franklin ◽  
Gregory Morrison ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electromagnetic Field ◽  
Contact Mode ◽  
Force Microscopy ◽  
Vibrational Response ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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