Observation of silicon carbide Schottky barrier diode under applied reverse bias using atomic force microscopy/Kelvin probe force microscopy/scanning capacitance force microscopy

2017 ◽  
Vol 56 (8S1) ◽  
pp. 08LB05 ◽  
Author(s):  
Takeshi Uruma ◽  
Nobuo Satoh ◽  
Hidekazu Yamamoto
Keyword(s):  
Silicon Carbide ◽  
Atomic Force Microscopy ◽  
Schottky Barrier ◽  
Reverse Bias ◽  
Schottky Barrier Diode ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

ACS Nano ◽  
2018 ◽  
Vol 12 (6) ◽  
pp. 5274-5283 ◽  
Author(s):  
Fabian Schulz ◽  
Juha Ritala ◽  
Ondrej Krejčí ◽  
Ari Paavo Seitsonen ◽  
Adam S. Foster ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

AIP Advances ◽  
2013 ◽  
Vol 3 (8) ◽  
pp. 082107 ◽  
Author(s):  
Yuanmin Du ◽  
Amit Kumar ◽  
Hui Pan ◽  
Kaiyang Zeng ◽  
Shijie Wang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Resistive Switching ◽  
Kelvin Probe Force Microscopy ◽  
Tio2 Films ◽  
Kelvin Probe ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

2018 ◽  
Vol 24 (2) ◽  
pp. 126-131 ◽  
Author(s):  
Sergey Y. Luchkin ◽  
Keith J. Stevenson
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
Electrostatic Force ◽  
Experimental Results ◽  
Kelvin Probe Force Microscopy ◽  
Atomic Force Microscopy Probe ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Potential Sensitivity

AbstractIn this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.

scholarly journals Elucidating the charge state of an Au nanocluster on the oxidized/reduced rutile TiO2 (110) surface using non-contact atomic force microscopy and Kelvin probe force microscopy

2020 ◽  
Vol 2 (6) ◽  
pp. 2371-2375 ◽  
Author(s):  
Yuuki Adachi ◽  
Huan Fei Wen ◽  
Quanzhen Zhang ◽  
Masato Miyazaki ◽  
Yasuhiro Sugawara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Charge State ◽  
High Vacuum ◽  
Kelvin Probe Force Microscopy ◽  
Ultra High Vacuum ◽  
Kelvin Probe ◽  
Au Nanoclusters ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force

The charge state of Au nanoclusters on oxidized/reduced rutile TiO2 (110) surfaces were investigated by a combination of non-contact atomic force microscopy and Kelvin probe force microscopy at 78 K under ultra-high vacuum.

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